Optimally mitigating BTI-induced FPGA device aging with discriminative voltage scaling (abstract only)

Author(s):  
Yu Bai ◽  
Mohammed Alawad ◽  
Mingjie Lin
Keyword(s):  
2012 ◽  
Vol E95-C (4) ◽  
pp. 546-554 ◽  
Author(s):  
Benjamin DEVLIN ◽  
Makoto IKEDA ◽  
Kunihiro ASADA

2008 ◽  
Vol 36 (1) ◽  
pp. 359-370
Author(s):  
Mahmut Kandemir ◽  
Ozcan Ozturk
Keyword(s):  

2002 ◽  
Vol 37 (7) ◽  
pp. 2-11 ◽  
Author(s):  
H. Saputra ◽  
M. Kandemir ◽  
N. Vijaykrishnan ◽  
M. J. Irwin ◽  
J. S. Hu ◽  
...  
Keyword(s):  

Author(s):  
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Jacopo Franco ◽  
Brecht Truijen ◽  
Philippe Roussel ◽  
Stanislav Tyaginov ◽  
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Alexandre Ferreira ◽  
Cosmin Rusu ◽  
Ruibin Xu ◽  
Frank Liberato ◽  
...  

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