Test coverage metrics for the network

Author(s):  
Xieyang Xu ◽  
Ryan Beckett ◽  
Karthick Jayaraman ◽  
Ratul Mahajan ◽  
David Walker
Author(s):  
STEPHEN C. MEDDERS ◽  
EDWARD B. ALLEN ◽  
EDWARD A. LUKE

Rule-based systems are typically tested using a set of inputs which will produce known outputs. However, one does not know how thoroughly the software has been exercised. Traditional test-coverage metrics do not account for the dynamic data-driven flow of control in rule-based systems. Our literature review found that there has been little prior work on coverage metrics for rule-based systems. This paper proposes test-coverage metrics for rule-based systems derived from metrics defined by prior work, and presents an industrial scale case study. We conducted a case study to evaluate the practicality and usefulness of the proposed metrics. The case study applied the metrics to a system for computational fluid-dynamics models based on a rule-based application framework. These models were tested using a regression-test suite. The data-flow structure built by the application framework, along with the regression-test suite, provided case-study data. The test suite was evaluated against three kinds of coverage. The measurements indicated that complete coverage was not achieved, even at the lowest level definition. Lists of rules not covered provided insight into how to improve the test suite. The case study illustrated that structural coverage measures can be utilized to measure the completeness of rule-based system testing.


IEEE Software ◽  
1985 ◽  
Vol 2 (2) ◽  
pp. 80-85 ◽  
Author(s):  
M.D. Weiser ◽  
J.D. Gannon ◽  
P.R. McMullin

Author(s):  
Rommel Estores ◽  
Karo Vander Gucht

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.


IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Imanol Allende ◽  
Nicholas Mc Guire ◽  
Jon Perez-Cerrolaza ◽  
Lisandro G. Monsalve ◽  
Jens Petersohn ◽  
...  

2017 ◽  
Vol 30 (4) ◽  
pp. 317-322 ◽  
Author(s):  
Yoshikazu Nagamura ◽  
Kenji Shiozawa ◽  
Toru Koyama ◽  
Jun Matsushima ◽  
Kazuhiro Tomonaga ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document