Test coverage metrics for the network

2021 ◽  
Author(s):  
Xieyang Xu ◽  
Ryan Beckett ◽  
Karthick Jayaraman ◽  
Ratul Mahajan ◽  
David Walker
Keyword(s):  
Test Coverage ◽  
Coverage Metrics

USING RULE STRUCTURE TO EVALUATE THE COMPLETENESS OF RULE-BASED SYSTEM TESTING: A CASE STUDY

2010 ◽  
Vol 20 (07) ◽  
pp. 975-986 ◽  
Author(s):  
STEPHEN C. MEDDERS ◽  
EDWARD B. ALLEN ◽  
EDWARD A. LUKE
Keyword(s):  
Test Suite ◽  
Application Framework ◽  
Test Coverage ◽  
Prior Work ◽  
Rule Based ◽  
Coverage Metrics ◽  
Rule Based System ◽  
Regression Test ◽  
Rule Based Systems

Rule-based systems are typically tested using a set of inputs which will produce known outputs. However, one does not know how thoroughly the software has been exercised. Traditional test-coverage metrics do not account for the dynamic data-driven flow of control in rule-based systems. Our literature review found that there has been little prior work on coverage metrics for rule-based systems. This paper proposes test-coverage metrics for rule-based systems derived from metrics defined by prior work, and presents an industrial scale case study. We conducted a case study to evaluate the practicality and usefulness of the proposed metrics. The case study applied the metrics to a system for computational fluid-dynamics models based on a rule-based application framework. These models were tested using a regression-test suite. The data-flow structure built by the application framework, along with the regression-test suite, provided case-study data. The test suite was evaluated against three kinds of coverage. The measurements indicated that complete coverage was not achieved, even at the lowest level definition. Lists of rules not covered provided insight into how to improve the test suite. The case study illustrated that structural coverage measures can be utilized to measure the completeness of rule-based system testing.

Comparison of Structural Test Coverage Metrics

IEEE Software ◽  
1985 ◽  
Vol 2 (2) ◽  
pp. 80-85 ◽  
Author(s):  
M.D. Weiser ◽  
J.D. Gannon ◽  
P.R. McMullin
Keyword(s):  
Test Coverage ◽  
Coverage Metrics ◽  
Structural Test

A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Extend ATPG Diagnostic Resolution in Localizing Faults

2019 ◽  
Author(s):  
Rommel Estores ◽  
Karo Vander Gucht
Keyword(s):  
Fault Injection ◽  
Fault Simulation ◽  
Fault Localization ◽  
Pattern Generation ◽  
Test Coverage ◽  
Actual Case ◽  
Electrical Failure ◽  
Starting Point ◽  
Diagnostic Resolution ◽  
Diagnosis Approach

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

scholarly journals Statistical test coverage for Linux-based next-generation autonomous safety-related systems

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Imanol Allende ◽  
Nicholas Mc Guire ◽  
Jon Perez-Cerrolaza ◽  
Lisandro G. Monsalve ◽  
Jens Petersohn ◽  
...  
Keyword(s):  
Statistical Test ◽  
Test Coverage ◽  
Next Generation

Layout-Based Test Coverage Verification for High-Reliability Devices

2017 ◽  
Vol 30 (4) ◽  
pp. 317-322 ◽  
Author(s):  
Yoshikazu Nagamura ◽  
Kenji Shiozawa ◽  
Toru Koyama ◽  
Jun Matsushima ◽  
Kazuhiro Tomonaga ◽  
...  
Keyword(s):  
High Reliability ◽  
Test Coverage
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