(Invited) Microwave-Based Metrology Platform Development: Application of Broad-Band RF Metrology to Integrated Circuit Reliability Analyses
2014 ◽
Vol 4
(1)
◽
pp. N3113-N3117
◽
2013 ◽
pp. 151-180
◽
1992 ◽
Vol 41
(3)
◽
pp. 458-465
◽