Improving the Relative Calculations of Volta Potential Differences Acquired from Scanning Kelvin Probe Force Microscopy (SKPFM) from Comparing an Inert Material to First-Principle Calculations
2010 ◽
Vol 114
(18)
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pp. 8474-8484
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Keyword(s):
2017 ◽
Vol 706
◽
pp. 126-135
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2006 ◽
Vol 153
(11)
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pp. B474
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Keyword(s):