Vacuum Plasma Electron Beam Melting of Reactive and Refractory Metals and Their Alloys: One Step Melting of Low Oxygen Content Titanium Scrap by Using VPEB

1981 ◽  
Vol 128 (11) ◽  
pp. 2453-2460
Author(s):  
S. Kashu ◽  
K. Watanabe ◽  
M. Nagase ◽  
C. Hayashi ◽  
Y. Yoneda
Keyword(s):  
Electron Beam ◽  
Oxygen Content ◽  
Electron Beam Melting ◽  
Plasma Electron ◽  
Refractory Metals ◽  
Low Oxygen ◽  
Vacuum Plasma ◽  
One Step

A Fore-Vacuum Plasma Electron Source of a Focused Electron Beam

2019 ◽  
Vol 83 (11) ◽  
pp. 1402-1406 ◽  
Author(s):  
I. Yu. Bakeev ◽  
A. S. Klimov ◽  
E. M. Oks ◽  
A. A. Zenin
Keyword(s):  
Electron Beam ◽  
Plasma Electron ◽  
Electron Source ◽  
Vacuum Plasma ◽  
Plasma Electron Source

scholarly journals Plasma Electron Beam Melting of 9 Titanium Alloys

1988 ◽  
Vol 74 (2) ◽  
pp. 278-285 ◽  
Author(s):  
Junji TAKAHASHI ◽  
Mitsutane FUJITA ◽  
Yoshikuni KAWABE
Keyword(s):  
Electron Beam ◽  
Titanium Alloys ◽  
Electron Beam Melting ◽  
Plasma Electron

Multielement ultratrace analysis of molybdenum with high performance secondary ion mass spectrometry

1988 ◽  
Vol 3 (4) ◽  
pp. 694-704 ◽  
Author(s):  
A. Virag ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
H. M. Ortner ◽  
P. Wilhartitz
Keyword(s):  
Mass Spectrometry ◽  
Electron Beam ◽  
Electron Beam Melting ◽  
Large Scale ◽  
Secondary Ion Mass Spectrometry ◽  
Refractory Metals ◽  
Oxide Semiconductor ◽  
Impurity Level ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Electron beam melting has been used to obtain ultrapure refractory metals that are gaining importance in metal oxide semiconductor-very large scale integration (MOS-VLSI) processing technology, fusion reactor technology, or as superconducting materials. Although the technology of electron beam melting is well established in the field of production of very clean refractory metals, little is known about the limitations of the method because the impurity level of the final products is frequently below the detection power of common methods for trace analysis. Characterization of these materials can be accomplished primarily by in situ methods like neutron activation analysis and mass spectrometric methods [glow discharge mass spectrometry (GDMS), secondary ion mass spectrometry (SIMS)]. A suitable method for quantitative multielement ultratrace bulk analysis of molybdenum with SIMS has been developed. Detection limits of the analyzed elements from 10−7g/gdown to 10−12g/g have been found. Additional information about the distribution of the trace elements has been accumulated.

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