scholarly journals Cast Structure of Electron-Beam Melted Nb Alloy Ingots (The Electron Beam Melting of the Refractory Metals (X))

1968 ◽  
Vol 32 (8) ◽  
pp. 796-802
Author(s):  
Tetsuya Takaai
Keyword(s):  
Electron Beam ◽  
Electron Beam Melting ◽  
Refractory Metals ◽  
Cast Structure

Multielement ultratrace analysis of molybdenum with high performance secondary ion mass spectrometry

1988 ◽  
Vol 3 (4) ◽  
pp. 694-704 ◽  
Author(s):  
A. Virag ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
H. M. Ortner ◽  
P. Wilhartitz
Keyword(s):  
Mass Spectrometry ◽  
Electron Beam ◽  
Electron Beam Melting ◽  
Large Scale ◽  
Secondary Ion Mass Spectrometry ◽  
Refractory Metals ◽  
Oxide Semiconductor ◽  
Impurity Level ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Electron beam melting has been used to obtain ultrapure refractory metals that are gaining importance in metal oxide semiconductor-very large scale integration (MOS-VLSI) processing technology, fusion reactor technology, or as superconducting materials. Although the technology of electron beam melting is well established in the field of production of very clean refractory metals, little is known about the limitations of the method because the impurity level of the final products is frequently below the detection power of common methods for trace analysis. Characterization of these materials can be accomplished primarily by in situ methods like neutron activation analysis and mass spectrometric methods [glow discharge mass spectrometry (GDMS), secondary ion mass spectrometry (SIMS)]. A suitable method for quantitative multielement ultratrace bulk analysis of molybdenum with SIMS has been developed. Detection limits of the analyzed elements from 10−7g/gdown to 10−12g/g have been found. Additional information about the distribution of the trace elements has been accumulated.

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