Effect of Nonannealed Ohmic-Recess Structure on Temperature-Dependent Characteristics of Metamorphic High-Electron-Mobility Transistors

2008 ◽  
Vol 155 (6) ◽  
pp. H443 ◽  
Author(s):  
Li-Yang Chen ◽  
Shiou-Ying Cheng ◽  
Kuei-Yi Chu ◽  
Tsung-Han Tsai ◽  
Tzu-Pin Chen ◽  
...  
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