Annealing-temperature Dependence of Compositional Depth Profile and Chemical Structures of LaOx/ScOx/Si and ScOx/LaOx/Si Interfacial Transition Layer

2019 ◽  
Vol 16 (5) ◽  
pp. 171-176 ◽  
Author(s):  
Hiroshi Nohira ◽  
Yoshinori Takenaga ◽  
Kuniyuki Kakushima ◽  
Parhat Ahmet ◽  
Kazuo Tsutsui ◽  
...  
Keyword(s):  
Temperature Dependence ◽  
Depth Profile ◽  
Transition Layer ◽  
Annealing Temperature ◽  
Chemical Structures ◽  
Compositional Depth Profile ◽  
Annealing Temperature Dependence

Annealing Temperature Dependence of Photoluminescence from Silicon-Rich Silica Films

2001 ◽  
Vol 3 (4) ◽  
pp. 891-895
Author(s):  
Wu Xue-mei ◽  
Zhuge Lan-jian ◽  
Tang Nai-yun ◽  
Ye Chun-nuan ◽  
Ning Zao-yuan ◽  
...  
Keyword(s):  
Temperature Dependence ◽  
Annealing Temperature ◽  
Silica Films ◽  
Annealing Temperature Dependence

Testing field and annealing temperature dependence of leakage properties in Bi3.25La0.75Ti3O12 thin films

2011 ◽  
Vol 519 (7) ◽  
pp. 2376-2380 ◽  
Author(s):  
Xiumei Wu ◽  
Shuai Dong ◽  
Ya Zhai ◽  
Mingxiang Xu ◽  
Yi Kan
Keyword(s):  
Thin Films ◽  
Temperature Dependence ◽  
Annealing Temperature ◽  
Testing Field ◽  
Annealing Temperature Dependence
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