scholarly journals Accelerated Testing of a High Temperature SOFC Fueled by PH3 Contaminated Coal Syngas

2010 ◽  
Keyword(s):  
High Temperature ◽  
Accelerated Testing ◽  
Coal Syngas

Microcircuit Accelerated Testing Using High Temperature Operating Tests

1975 ◽  
Vol R-24 (4) ◽  
pp. 238-250 ◽  
Author(s):  
Morton Stitch ◽  
Gordon M. Johnson ◽  
Bruce P. Kirk ◽  
Joseph B. Brauer
Keyword(s):  
High Temperature ◽  
Accelerated Testing ◽  
Temperature Operating

High-Temperature Coal-Syngas Plasma Characteristics for Advanced MHD Power Generation

2006 ◽  
Vol 21 (1) ◽  
pp. 242-249 ◽  
Author(s):  
A.V. Mikheev ◽  
N. Kayukawa ◽  
N. Okinaka ◽  
Y. Kamada ◽  
S. Yatsu
Keyword(s):  
Power Generation ◽  
High Temperature ◽  
Coal Syngas ◽  
Plasma Characteristics

On Accelerated Testing of Stabilizers for High-Heat-Resistant Polymers

2019 ◽  
Vol 816 ◽  
pp. 61-66
Author(s):  
Elina V. Khakyasheva ◽  
A.S. Shabaev ◽  
Azamat Zhansitov ◽  
S.Yu. Khashirova ◽  
K.K. Sapaev
Keyword(s):  
Gas Chromatography ◽  
High Temperature ◽  
High Heat ◽  
Test Method ◽  
Accelerated Testing ◽  
Operating Environment ◽  
Heat Resistant ◽  
Ether Ether Ketone ◽  
Poly Ether Ether Ketone ◽  
Ether Ketone

An attempt was made to evaluate the effect of the stabilizer on poly (ether ether ketone) by gas chromatography using a new high-temperature cell. The proposed test method allows you to quickly assess the effects of stabilization and allows you to predict the behavior of the material in the operating environment.

Lifetime and Failure Modes of High Temperature SOI Products

2018 ◽  
Vol 2018 (HiTEC) ◽  
pp. 000112-000115 ◽  
Author(s):  
Derek Maxwell ◽  
Marshall Soares ◽  
Matt Coreless
Keyword(s):  
High Temperature ◽  
Failure Modes ◽  
Extreme Temperature ◽  
Silicon On Insulator ◽  
Accelerated Testing ◽  
Test Results ◽  
Life Test ◽  
Tungsten Metal

Abstract RelChip has performed life test studies on its RAM and has shown that Silicon On Insulator (SOI) processing with Aluminum-Tungsten metal traces can operate for over 4000 hours at 350°C and do not fail due to electromigration. Three parts were randomly selected and functionally tested at the extreme temperature using accelerated testing (HAST). The parts were pulled periodically for in-depth testing and examination. Test results indicate failures are due to device failures, and not electromigration.

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