scholarly journals Nanoscale Thin Film Corrosion Barriers Enabled By Multilayer Polymer Clay Nanocomposites

2020 ◽  
Vol MA2020-02 (13) ◽  
pp. 1339-1339
Author(s):  
Eric John Schindelholz ◽  
Michael Anthony Melia ◽  
Erik Spoerke ◽  
Stephen Percival ◽  
Jaime Grunlan ◽  
...  
Keyword(s):  
Thin Film ◽  
Clay Nanocomposites ◽  
Nanoscale Thin Film

scholarly journals Nanoscale thin film corrosion barriers enabled by multilayer polymer clay nanocomposites

2020 ◽  
Vol 383 ◽  
pp. 125228 ◽  
Author(s):  
Stephen J. Percival ◽  
Michael A. Melia ◽  
Christopher L. Alexander ◽  
Derek W. Nelson ◽  
Eric J. Schindelholz ◽  
...  
Keyword(s):  
Thin Film ◽  
Clay Nanocomposites ◽  
Nanoscale Thin Film

Atomistic and macroscopic characterization of nanoscale thin film liquid-vapor phase change phenomena

2021 ◽  
Vol 170 ◽  
pp. 107159
Author(s):  
Md Muntasir Alam ◽  
Md Shajedul Hoque Thakur ◽  
Mahmudul Islam ◽  
Mohammad Nasim Hasan ◽  
Yuichi Mitsutake ◽  
...  
Keyword(s):  
Thin Film ◽  
Phase Change ◽  
Vapor Phase ◽  
Nanoscale Thin Film ◽  
Phase Change Phenomena ◽  
Liquid Vapor

Incomplete Wetting of Nanoscale Thin-Film Structures

2003 ◽  
Vol 150 (8) ◽  
pp. G476 ◽  
Author(s):  
Matthew T. Spuller ◽  
Dennis W. Hess
Keyword(s):  
Thin Film ◽  
Nanoscale Thin Film ◽  
Incomplete Wetting

Thermal and Electrical Properties of a Suspended Nanoscale Thin Film

2006 ◽  
Vol 28 (1) ◽  
pp. 33-43 ◽  
Author(s):  
X. Zhang ◽  
H. Q. Xie ◽  
M. Fujii ◽  
H. Ago ◽  
K. Takahashi ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Nanoscale Thin Film ◽  
Thermal And Electrical Properties

Research on Material Thickness and Material Properties with Application of Sensors

2014 ◽  
Vol 1021 ◽  
pp. 33-36
Author(s):  
Zhi Qiang Xu
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Rapid Development ◽  
Michelson Interferometer ◽  
Basic Research ◽  
Research Field ◽  
Thin Film Technology ◽  
Optical Films ◽  
Solid Film ◽  
Nanoscale Thin Film

With the wide application of thin film technology and optoelectronic devices, optical films have been widely used in the development and production of weapons and special devices for basic research. Faced with constantly updated status quo and development of optical thin film precision measurement of various parameters on a higher requirements, the film thickness is one of the key parameters in film design and manufacturing process. Particularly with the rapid development of nanoscale thin-film technology, the film thickness becomes a hot issue in the research field. For solid film thickness, the main measuring means are screw micrometer, microscopy, interferometry and polarization. Conventional Michelson interferometer can measure thin film thickness which is transparent and known, and the devices with sensors performance better.

scholarly journals Nanoscale thin-film flows with thermal fluctuations and slip

2020 ◽  
Vol 102 (5) ◽  
Author(s):  
Yixin Zhang ◽  
James E. Sprittles ◽  
Duncan A. Lockerby
Keyword(s):  
Thin Film ◽  
Thermal Fluctuations ◽  
Nanoscale Thin Film ◽  
Film Flows
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