X-Ray Fluorescence Analysis of Portland Cement Through the Use of Experimentally Determined Correction Factors

1973 ◽  
Vol 17 ◽  
pp. 214-224
Author(s):  
C. H. Anderson ◽  
J. E. Mander ◽  
J. W. Leitner
Keyword(s):  
Portland Cement ◽  
Fluorescence Analysis ◽  
Reference Standards ◽  
Primary Radiation ◽  
Correction Factors ◽  
Standard Samples ◽  
Cement Sample ◽  
Average Deviation ◽  
X Ray

AbstractCorrection factors, termed α-factors, similar to those defined by LaChance and Traill have been generated by the addition of variable, known amounts of individual oxides, or other compounds, to a base cement sample and measuring the x-ray intensities of the elements of interest. The effects of all common constituents of cement on the determination of CaO, SiO2 and Al2O3 were found. Factors for rhodium and chromium primary radiation were determined and, in general, showed small but significant differences. The factors for rhodium at 50kV and 30kV were substantia11y identical. The correction factors were tested through the use of the NBS 1011- 1016 cements as reference standards to analyze the new proposed NBS cement series. The correction factors not only furnished improved calibration curves, but also allowed the determination of CaO, Al2O3 and SiO2 with an average deviation of less than 0.2% (absolute) from the provisional values furnished with the standard samples.

Sorption of Se (IV) from aqueous solutions with subsequent determination by X-ray fluorescence analysis

2020 ◽  
Vol 86 (10) ◽  
pp. 5-9
Author(s):  
D. G. Filatova ◽  
A. A. Arkhipenko ◽  
M. A. Statkus ◽  
V. V. Es’kina ◽  
V. B. Baranovskaya ◽  
...  
Keyword(s):  
Inductively Coupled Plasma ◽  
Fluorescence Analysis ◽  
Standard Samples ◽  
Phase Contact Time ◽  
Sorbent Phase ◽  
X Ray ◽  
Fundamental Parameters ◽  
Inductively Coupled ◽  
Subsequent Determination

An approach to sorptive separation of Se (IV) from solutions on a novel S,N-containing sorbent with subsequent determination of the analyte in the sorbent phase by micro-x-ray fluorescence method is presented. The sorbent copolymethylenesulfide-N-alkyl-methylenamine (CMA) was synthesized using «snake in the cage» procedure and proven to be stable in acid solutions. Conditions for quantitative extraction of Se (IV) were determined: sorption in 5 M HCl or 0.05 M HNO3 solutions when heated to 60°C, phase contact time being 1 h. The residual selenium content in the solution was determined by inductively coupled plasma mass spectrometry (ICP-MS) using 82Se isotope. The absence of selenium losses is proved and the mechanism of sorption interaction under specified conditions is proposed. The method of micro-x-ray fluorescence analysis (micro-RFA) with mapping revealed a uniform distribution of selenium on the sorbent surface. The possibility of determining selenium in the sorbent phase by micro-RFA is shown. When comparing the obtained results with the results of calculations by the method of fundamental parameters, it is shown the necessity of using standard samples of sorbates to obtain correct results of RFA determination of selenium in the sorbent phase.

Method of Measurement of Mean Concentration for an Element Segregated in Layers by X-Ray Analysis

1977 ◽  
Vol 21 ◽  
pp. 143-147
Author(s):  
I. Vander
Keyword(s):  
Fluorescence Analysis ◽  
Primary Radiation ◽  
Angle Of Incidence ◽  
Simple Method ◽  
X Ray ◽  
Elemental Compositions ◽  
Detection Angle ◽  
Method Of Measurement ◽  
Mean Concentration

Traditionally, in X-ray fluorescence analysis for the determination of elemental compositions, the fluorescence is measured from the irradiated side of the sample. The composition measurements obtained by this method are sensitive to a gradient in composition as a function of depth of the element being measured. This report presents a simple method for measuring a mean composition for an element segregated in layers applicable to thin samples so that the fluorescence can be measured on the side opposite to that being irradiated. It is shown that for a particular relation between the angle of incidence of the primary radiation and of the detection angle on the opposite side of the sample that a mean concentration can be measured for an element which is independent of the composition in the separate layers.

Determination of the composition of binary chalcogenide glasses by X-ray fluorescence analysis

2010 ◽  
Vol 44 (1) ◽  
pp. 24-27 ◽  
Author(s):  
G. A. Bordovsky ◽  
A. V. Marchenko ◽  
P. P. Seregin ◽  
N. N. Smirnova ◽  
E. I. Terukov
Keyword(s):  
Chalcogenide Glasses ◽  
Fluorescence Analysis ◽  
X Ray

Evaluation of Geochemical Reference Standards by X-Ray Fluorescence Analysis

1987 ◽  
Vol 11 (1) ◽  
pp. 107-113 ◽  
Author(s):  
Allen L. Stork ◽  
David K. Smith ◽  
James B. Gill
Keyword(s):  
Fluorescence Analysis ◽  
Reference Standards ◽  
X Ray

ANALYSIS OF SOLDERS ON TIN AND LEAD BASES BY X-RAY FLOORESCENT SPECTROSCOPY

2021 ◽  
pp. 124-131
Author(s):  
A.V. Alekseev ◽  
◽  
G.V. Orlov ◽  
P.S. Petrov ◽  
A.V. Slavin ◽  
...  
Keyword(s):  
Emission Spectroscopy ◽  
High Resolution Mass Spectrometry ◽  
Analytical Signal ◽  
Atomic Emission ◽  
Standard Samples ◽  
X Ray ◽  
Fundamental Parameters ◽  
The Matrix ◽  
Resolution Mass

The determination of the elements Cu, Ni, Sb, Bi, Pb, Zn and Fe in the tin-based solder VPr35, as well as the elements Sn, Ni, Sb, Bi and In in the lead-based VPr40 solder by the method of х-ray fluorescence spectroscopy has been carried out. The calibration dependences are corrected taking into account the superposition of signals from interfering elements on the analytical signal and changes in intensity caused by inter-element influences in the matrix. The analysis was carried out by the method of fundamental parameters without using standard samples. The correctness of the results obtained was confirmed by their comparative analysis by atomic emission spectroscopy and high-resolution mass spectrometry with a glow discharge.

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