scholarly journals Hilbert Based Testing of ADC Differential Non-linearity Using Wavelet Transform Algorithms

Author(s):  
Emad A. Awada

In testing Mixed Signal Devices such as Analog to Digital and Digital to Analog Converters, some dynamic parameters, such as Differential Non-Linearity and Integral Non-linearity, are very critical to evaluating devises performance. However, such analysis has been notorious for complexity and massive compiling process. Therefore, this research will focus on testing dynamic parameters such as Differential Non-Linearity by simulating numerous numbers of bits Analog to Digital Converters and test the output signals base on new testing algorithms of Wavelet transform based on Hilbert process. Such a new testing algorithm should enhance the testing process by using less compiling data samples and prompt testing results. In addition, new testing results will be compared with the conventional testing process of Histogram algorithms for accuracy and enactment.

2014 ◽  
Vol 23 (01n02) ◽  
pp. 1450002
Author(s):  
Pawan Gogna ◽  
Murali Lingalugari ◽  
John Chandy ◽  
Evan Heller ◽  
Faquir Jain

In this paper, we are presenting fast digital to analog convertor designs using Spatial Waveform Switched FETs (SWSFET). SWSFET was introduced by Jain et.al. These FETs have multiple channels stacked vertically. The Carrier wavefunction switches from one channel to another with the application of different gate voltages. Designs of multi-bit SRAM, logic and sequential cells using SWSFETs have been demonstrated. Here we are introducing the use of SWSFET in mixed signal architectures. Single cycle architectures for two-bit, four-bit and eight-bit analog to digital converters are presented. Four bit architecture has been simulated and results are discussed. SWSFET presents the opportunity with its multiple stacked channel features to extend the Moors law using next generation of devices.


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