Photo-Thermally Induced Current Switching in Vanadium-Dioxide-Based Devices Using CO2 Laser Pumping

2015 ◽  
Vol 15 (11) ◽  
pp. 8484-8488 ◽  
Author(s):  
Jihoon Kim ◽  
Songhyun Jo ◽  
Kyongsoo Park ◽  
Bong-Jun Kim ◽  
Yong Wook Lee
Keyword(s):  
Vanadium Dioxide ◽  
Induced Current ◽  
Thermally Induced ◽  
Current Switching ◽  
Laser Pumping

Analytical and Experimental Studies on Induced Current Switching by a Fault-Proof Gas Insulated Earthing Switch

2010 ◽  
Vol 11 (5) ◽  
Author(s):  
Mandava Mohana Rao ◽  
Moutusi Paul ◽  
H.S. Jain
Keyword(s):  
Short Circuit ◽  
Experimental Studies ◽  
Short Circuit Current ◽  
Design Parameters ◽  
Induced Current ◽  
Current Switching ◽  
Test Circuit ◽  
Reliable Performance ◽  
Gas Insulated Substation ◽  
The Impact

Fault-proof earthing switches are one of the important modules of a gas insulated substation, as it enables make at 100 percent short circuit current, which is functionally different from maintenance earthing switches. The fault-proof earthing switch shall be designed to make and break electro-magnetically and electro-statically induced currents as per IEC-62271-102. The paper discusses the impact of “test circuit configurations and voltage” on test parameters for gas insulated fault-proof earthing switch utilizing simulation with PSCAD software. Authors record the development of a 145 kV gas insulated fault proof earthing switch by considering novel design features like minimum arcing/pre-arcing time, effective current transfer from arcing contact to ground terminal, etc. The development has been evaluated successfully for electro-magnetically and electro-statically induced current duties as per IEC. Finally, design parameters to be considered for ensuring reliable performance during induced current switching from fault-proof earthing switches are also discussed.

Thermally induced current bifurcation in bipolar transistors

2006 ◽  
Vol 50 (5) ◽  
pp. 877-888 ◽  
Author(s):  
L. La Spina ◽  
N. Nenadović ◽  
V. d’Alessandro ◽  
F. Tamigi ◽  
N. Rinaldi ◽  
...  
Keyword(s):  
Bipolar Transistors ◽  
Induced Current ◽  
Thermally Induced

Ultrathin Nanosheets of Half-Metallic Monoclinic Vanadium Dioxide with a Thermally Induced Phase Transition

2013 ◽  
Vol 52 (29) ◽  
pp. 7554-7558 ◽  
Author(s):  
Tao Yao ◽  
Liang Liu ◽  
Chong Xiao ◽  
Xiaodong Zhang ◽  
Qinghua Liu ◽  
...  
Keyword(s):  
Phase Transition ◽  
Vanadium Dioxide ◽  
Half Metallic ◽  
Thermally Induced ◽  
Ultrathin Nanosheets

Ultrathin Nanosheets of Half-Metallic Monoclinic Vanadium Dioxide with a Thermally Induced Phase Transition

2013 ◽  
Vol 125 (29) ◽  
pp. 7702-7706 ◽  
Author(s):  
Tao Yao ◽  
Liang Liu ◽  
Chong Xiao ◽  
Xiaodong Zhang ◽  
Qinghua Liu ◽  
...  
Keyword(s):  
Phase Transition ◽  
Vanadium Dioxide ◽  
Half Metallic ◽  
Thermally Induced ◽  
Ultrathin Nanosheets

An Analytical Technique to Assess the Risk of Laser Damage to Encapsulated Integrated Circuits during Package Laser Marking

2008 ◽  
Author(s):  
Joseph Patterson ◽  
Cliff Schuring
Keyword(s):  
Integrated Circuits ◽  
Optical Beam ◽  
Laser Damage ◽  
Induced Current ◽  
Induced Voltage ◽  
Laser Marking ◽  
Thermally Induced ◽  
Analytical Technique ◽  
Optical Beam Induced Current

Abstract Damage to encapsulated integrated circuits has recently been reported due to Laser marking of the package. A method to assess the risk of such damage is presented. The method is an analytical technique using Thermally Induced Voltage Alteration (XIVA) and Optical Beam Induced Current (OBIC) imaging.

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