On the effect of measurement errors in simultaneous monitoring of mean vector and covariance matrix of multivariate processes

2016 ◽  
Vol 40 (1) ◽  
pp. 318-330 ◽  
Author(s):  
Amirhossein Amiri ◽  
Reza Ghashghaei ◽  
Mohammad Reza Maleki

In this paper, we investigate the misleading effect of measurement errors on simultaneous monitoring of the multivariate process mean and variability. For this purpose, we incorporate the measurement errors into a hybrid method based on the generalized likelihood ratio (GLR) and exponentially weighted moving average (EWMA) control charts. After that, we propose four remedial methods to decrease the effects of measurement errors on the performance of the monitoring procedure. The performance of the monitoring procedure as well as the proposed remedial methods is investigated through extensive simulation studies and a real data example.

2018 ◽  
Vol 2018 ◽  
pp. 1-15 ◽  
Author(s):  
Hina Khan ◽  
Saleh Farooq ◽  
Muhammad Aslam ◽  
Masood Amjad Khan

This study proposes EWMA-type control charts by considering some auxiliary information. The ratio estimation technique for the mean with ranked set sampling design is used in designing the control structure of the proposed charts. We have developed EWMA control charts using two exponential ratio-type estimators based on ranked set sampling for the process mean to obtain specific ARLs, being suitable when small process shifts are of interest.


Author(s):  
Jiangbin Yang ◽  
Viliam Makis

A usual approach to monitoring an autocorrelated process is to apply a control chart to the process residuals. In this paper, we study the statistical behavior of the residuals of a controlled second-order autoregressive (AR(2)) cutting process when a special-cause shift occurs to the process mean. Shewhart, exponentially weighted moving average (EWMA) and cumulative sum (CUSUM) control charts are applied to the residuals to monitor the cutting process. Formulas, integral equations and recursive procedures for computing the average run lengths (ARLs) of the charts are derived. Numerical results are presented and the relative performance of the charts is investigated.


Symmetry ◽  
2022 ◽  
Vol 14 (1) ◽  
pp. 159
Author(s):  
Xuelong Hu ◽  
Suying Zhang ◽  
Guan Sun ◽  
Jianlan Zhong ◽  
Shu Wu

Much research has been conducted on two-sided Exponentially Weighted Moving Average (EWMA) control charts, while less work has been devoted to the one-sided EWMA charts. Traditional one-sided EWMA charts involve resetting the EWMA statistic to the target whenever it falls below or above the target, or truncating the observations above or below the target and further applying the EWMA statistic to the truncated samples. In order to further improve the performance of traditional one-sided EWMA mean (X¯) charts, this paper studies the performance of the Modified One-sided EWMA (MOEWMA) X¯ charts to monitor a normally distributed process. The Monte-Carlo simulation method is used to obtain the zero- and steady-state Run Length (RL) properties of the proposed control charts. Through extensive simulations and comparisons with other charts, it is shown that the proposed MOEWMA X¯ charts compare favorably with some existing competing charts. Moreover, by attaching the variable sampling intervals (VSI) feature to the MOEWMA X¯ charts, it is shown that the VSI MOEWMA charts outperform the corresponding charts without the VSI feature. Finally, a real data example from manufacturing process shows the implementation of the proposed one-sided charts.


2009 ◽  
Vol 57 (1) ◽  
pp. 401-407 ◽  
Author(s):  
Shey-Huei Sheu ◽  
Shih-Hung Tai ◽  
Yu-Tai Hsieh ◽  
Tse-Chieh Lin

2012 ◽  
Vol 157-158 ◽  
pp. 1655-1660
Author(s):  
Hae Woon Kang ◽  
Jae Won Baik ◽  
Young Jae Choi ◽  
Sung Ho Nam

Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. Recently, H.W. Kang et al.[7] introduced Demerit-GWMA(generally weighted moving average) and Demerit-EWMA control charts that can detect small shifts of the process mean more sensitively than the classical demerit control charts. In this paper, we present an effective method for process control using the Demerit-GWMA statistics with fast initial response. Moreover, we evaluate exact performance of the Demerit-GWMA control chart with fast initial response(FIR), Demerit-GWMA and Demerit-EWMA according to changing sample size or parameters.


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