Size-dependent dynamic behavior of microcantilevers under suddenly applied DC voltage

Author(s):  
Masoud Rahaeifard ◽  
Mohammad Taghi Ahmadian ◽  
Keikhosrow Firoozbakhsh

This paper investigates the dynamic behavior of microcantilevers under suddenly applied DC voltage based on the modified couple stress theory. The cantilever is modeled based on the Euler–Bernoulli beam theory and equation of motion is derived using Hamilton’s principle. Both analytical and numerical methods are utilized to predict the dynamic behavior of the microbeam. Multiple scales method is used for analytical analysis and the numerical approach is based on a hybrid finite element/finite difference method. The results of the modified couple stress theory are compared with those from the literature as well as the results predicted by the classical theory. It is shown that the modified couple stress theory predicts size-dependent normalized dynamic behavior for the microbeam while according to the classical theory the normalized behavior of the microbeam is independent of its size. When the thickness of the beam is in order of its material length scale, the difference between the results given by the modified couple stress theory and those predicted by the classical theory is considerable. As the beam thickness increases, the results of the modified couple stress theory converge to those of the classical theory.

2017 ◽  
Vol 09 (08) ◽  
pp. 1750113 ◽  
Author(s):  
S. Hakamiha ◽  
M. Mojahedi

This paper introduces a new nonlinear model for microswitches based on the modified couple stress theory. The microswitch includes a microbeam which is connected to the clamped support from one side and attached to an electrostatically driven proof mass with a large gap from the other side. The microswitch operates in the pull-in instability with large deformation. The effects of fringing field and large curvature as well as size dependency are considered in the modeling. With regard to the size-dependent model, the equations of motion are obtained using Hamilton’s principle and solved by both numerical and analytical approaches. Consequently, dynamic pull-in instability is investigated based on the analytical and numerical solutions for dynamic conditions. The results depict that the dynamic deflection predicted by the modified couple stress theory is smaller than that obtained by the classical theory. The classical theory underestimates the pull-in instability voltage of the microswitches especially when the beam’s thickness is in the order of material length scale parameter. Furthermore, it is shown that neglecting nonlinearity due to large deflection leads to significant errors in the pull-in instability of the microstructures and these errors are calculated. The novelty of this paper is to provide a nonlinear size-dependent model for microswitches and to investigate the nonlinearity and instability of microswitches based on this model using the analytical and numerical methods.


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