In situ high temperature single crystal X-ray diffraction study of a natural omphacite
Keyword(s):
X Ray
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AbstractIn situ high temperature single crystal X-ray diffraction (XRD) experiments have been performed on a chemically quasi-ideal omphacite sample up to 1000°C. The lattice parameters were studied as a function of temperature, and their thermal expansion coefficients determined. The b and c cell edges show discontinuities as a function of temperature which are interpreted here in terms of intracrystalline cation diffusion processes. Structure refinements have been carried out using data collected at room temperature, at 800°C and at ambient conditions after cooling. The structural behaviour as a function of temperature of chemically quasi-ideal omphacites is compared with those of jadeite and diopside.
2019 ◽
Vol 275
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pp. 180-190
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2012 ◽
Vol 76
(4)
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pp. 933-948
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2005 ◽
Vol 61
(6)
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pp. 656-662
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2021 ◽
Vol 311
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pp. 110648
2014 ◽
Vol 70
(a1)
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pp. C79-C79
2019 ◽
Vol 274
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pp. 171-175
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