Characterization of mineral surfaces and water/mineral interfacial processes


1998 ◽  
Vol 4 (S2) ◽  
pp. 600-601
Author(s):  
John Rakovan ◽  
F. Hochella Michael

Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the interactions that take place at a solid-solution interface.SPM has been used in mineralogy and geochemistry since 1989. Here as in other applications the great strength of SPM is in the characterization of the heterogeneous nature of mineral surfaces and the ability to observe many geochemical processes in real time.



2020 ◽  
Vol MA2020-02 (1) ◽  
pp. 159-159
Author(s):  
Di Huang ◽  
Chaiwat Engtrakul ◽  
Sanjini U. Nanayakkara ◽  
Hongmei Luo ◽  
Robert Tenent




RSC Advances ◽  
2012 ◽  
Vol 2 (29) ◽  
pp. 10994 ◽  
Author(s):  
Minghua Huang ◽  
John B. Henry ◽  
Philippe Fortgang ◽  
Jörg Henig ◽  
Nicolas Plumeré ◽  
...  


2018 ◽  
Vol 15 (7) ◽  
pp. 358-369
Author(s):  
Jean-Claude Okaingni ◽  
Sié Ouattara ◽  
Adles Kouassi ◽  
Alain Clément


1993 ◽  
Vol 72 (4) ◽  
pp. 301-306 ◽  
Author(s):  
Tracy N. Tingle ◽  
Robert S. Borch ◽  
Michael F. Hochella ◽  
Christopher H. Becker ◽  
William J. Walker


1979 ◽  
pp. 457-475 ◽  
Author(s):  
P. Somasundaran ◽  
Brij M. Moudgil
Keyword(s):  




1973 ◽  
Vol 6 (1) ◽  
pp. 43-49 ◽  
Author(s):  
G. W. Bailey ◽  
S. W. Karickhoff


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