Low Power Testing of VLSI Circuits Using Test Vector Reordering

International Journal of Electrical Energy ◽

10.12720/ijoee.2.4.284-288 ◽

2014 ◽

Vol 2 (4) ◽

Author(s):

A. M. Sudha

Keyword(s):

Low Power ◽

Vlsi Circuits ◽

Test Vector ◽

Low Power Testing ◽

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An efficient test vector ordering method for low power testing

IEEE Computer Society Annual Symposium on VLSI ◽

10.1109/isvlsi.2004.1339559 ◽

2004 ◽

Author(s):

X. Kavousianos ◽

D. Bakalis ◽

M. Bellos ◽

D. Nikolos

Keyword(s):

Low Power ◽

Test Vector ◽

Low Power Testing ◽

Efficient Test ◽

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Survey of low power testing of VLSI circuits

2012 International Conference on Computer Communication and Informatics ◽

10.1109/iccci.2012.6158884 ◽

2012 ◽

Author(s):

P. Basker ◽

A. Arulmurugan

Keyword(s):

Low Power ◽

Vlsi Circuits ◽

Low Power Testing ◽

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Particle Swarm Optimization Framework for Low Power Testing of VLSI Circuits

International Journal of Artificial Intelligence & Applications ◽

10.5121/ijaia.2011.2302 ◽

2011 ◽

Vol 2 (3) ◽

pp. 13-20

Author(s):

Balwnder Singh ◽

Sukhleen Bindra Narang ◽

Arun Khosla

Keyword(s):

Particle Swarm Optimization ◽

Low Power ◽

Particle Swarm ◽

Vlsi Circuits ◽

Swarm Optimization ◽

Low Power Testing ◽

Optimization Framework ◽

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Survey of low-power testing of VLSI circuits

IEEE Design & Test of Computers ◽

10.1109/mdt.2002.1003802 ◽

2002 ◽

Vol 19 (3) ◽

pp. 82-92 ◽

Author(s):

P. Girard

Keyword(s):

Low Power ◽

Vlsi Circuits ◽

Low Power Testing ◽

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Low power testing of VLSI circuits: problems and solutions

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) ◽

10.1109/isqed.2000.838871 ◽

2002 ◽

Author(s):

P. Girard

Keyword(s):

Low Power ◽

Vlsi Circuits ◽

Low Power Testing ◽

Problems And Solutions ◽

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Survey of Low Power Testing of VLSI Circuits

Science Journal of Circuits Systems and Signal Processing ◽

10.11648/j.cssp.20130202.15 ◽

2013 ◽

Vol 2 (2) ◽

pp. 67 ◽

Author(s):

P. Basker

Keyword(s):

Low Power ◽

Vlsi Circuits ◽

Low Power Testing ◽

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Low power testing by test vector ordering with vector repetition

International Symposium on Signals Circuits and Systems Proceedings SCS 2003 (Cat No 03EX720) ISQED-04 ◽

10.1109/isqed.2004.1283674 ◽

2004 ◽

Author(s):

M. Bellos ◽

D. Bakalis ◽

D. Nikolos ◽

X. Kavousianos

Keyword(s):

Low Power ◽

Test Vector ◽

Low Power Testing ◽

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Low Power Testing based on MOS Design Modified Flip-Flop

Indian Journal of Science and Technology ◽

10.17485/ijst/2016/v9i29/91653 ◽

2016 ◽

Vol 9 (29) ◽

Author(s):

Anjali Chava ◽

S. Saravanan

Keyword(s):

Low Power ◽

Flip Flop ◽

Low Power Testing ◽

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Low power testing - What can commercial DFT tools provide?

2011 International Green Computing Conference and Workshops ◽

10.1109/igcc.2011.6008609 ◽

2011 ◽

Author(s):

Xijiang Lin

Keyword(s):

Low Power ◽

Low Power Testing ◽

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A new BIST structure for low power testing

2003 5th International Conference on ASIC Proceedings (IEEE Cat No 03TH8690) ICASIC-03 ◽

10.1109/icasic.2003.1277425 ◽

2003 ◽

Author(s):

Li Jie ◽

Yang Jun ◽

Li Rui ◽

Wang Chao

Keyword(s):

Low Power ◽

Low Power Testing ◽

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