728 Monitoring of fast recovery of elastic constant in metallic thin films after deposition

2008 ◽  
Vol 2008.83 (0) ◽  
pp. _7-28_
Author(s):  
Takeo NAKASHIMA ◽  
Nobutomo NAKAMURA ◽  
Hirotsugu OGI ◽  
Masahiko HIRAO ◽  
Masayoshi NISHIYAMA
2010 ◽  
Vol 107 (10) ◽  
pp. 103541 ◽  
Author(s):  
N. Nakamura ◽  
T. Nakashima ◽  
H. Ogi ◽  
M. Hirao ◽  
M. Nishiyama

Author(s):  
R. H. Geiss

The theory and practical limitations of micro area scanning transmission electron diffraction (MASTED) will be presented. It has been demonstrated that MASTED patterns of metallic thin films from areas as small as 30 Åin diameter may be obtained with the standard STEM unit available for the Philips 301 TEM. The key to the successful application of MASTED to very small area diffraction is the proper use of the electron optics of the STEM unit. First the objective lens current must be adjusted such that the image of the C2 aperture is quasi-stationary under the action of the rocking beam (obtained with 40-80-160 SEM settings of the P301). Second, the sample must be elevated to coincide with the C2 aperture image and its image also be quasi-stationary. This sample height adjustment must be entirely mechanical after the objective lens current has been fixed in the first step.


1989 ◽  
Vol 174 ◽  
pp. 11-24 ◽  
Author(s):  
S. Schneider ◽  
H. Schröder ◽  
K. Samwer ◽  
B. Schuhmacher ◽  
U. Köster

1996 ◽  
Vol 2 (3) ◽  
pp. 231-258 ◽  
Author(s):  
Dimitrios Maroudas ◽  
Matthew N. Enmark ◽  
Cora M. Leibig ◽  
Sokrates T. Pantelides

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