20921 Design and construction of large size re-entrant resonant cavity applicator for deep tumors in abdominal region without contact.

For the upcoming upgrade of the forward muon stations of the ATLAS detector, 1280m2 of Micromegas chambers have to be constructed. The industrialization of anode board production is an essential precondition. Design and construction methods of these boards have been optimized towards mass production. In parallel quality control procedures have been developed and established. The first set of large size Micromegas anode boards has finally been produced in industries and demonstrates the feasibility of the project on full-scale.

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Design and Construction of Resonant Cavity Applicator for Brain Tumor Hyperthermia Treatment without Contact

2006 International Conference of the IEEE Engineering in Medicine and Biology Society ◽

10.1109/iembs.2006.260763 ◽

2006 ◽

Author(s):

Y. Takahashi ◽

K. Kato ◽

K. Tsuchiya ◽

T. Yabuhara ◽

T. Uzuka ◽

...

Keyword(s):

Brain Tumor ◽

Resonant Cavity ◽

Hyperthermia Treatment ◽

Tumor Hyperthermia ◽

Design And Construction

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Design and construction of large size micromegas chambers for the ATLAS upgrade of the Muon Spectrometer

2015 4th International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA) ◽

10.1109/animma.2015.7465591 ◽

2015 ◽

Author(s):

Fabien Jeanneau

Keyword(s):

Muon Spectrometer ◽

Large Size ◽

Design And Construction

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Design and Construction of Large Size Micromegas Chambers for the ATLAS Upgrade of the Muon Spectrometer

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2016.2590601 ◽

2016 ◽

Vol 63 (4) ◽

pp. 2336-2342

Author(s):

Fabien Jeanneau

Keyword(s):

Muon Spectrometer ◽

Large Size ◽

Design And Construction

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Coherency loss in γ' precipitates in nickel-base superalloy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075014 ◽

1983 ◽

Vol 41 ◽

pp. 244-245

Author(s):

R. A. Ricks ◽

Angus J. Porter

Keyword(s):

Lattice Mismatch ◽

Lattice Parameter ◽

Nickel Base Superalloy ◽

Large Size ◽

The Matrix ◽

Nimonic 80A ◽

Interfacial Dislocations ◽

Nickel Base ◽

Coherency Loss ◽

Nimonic 115

During a recent investigation concerning the growth of γ' precipitates in nickel-base superalloys it was observed that the sign of the lattice mismatch between the coherent particles and the matrix (γ) was important in determining the ease with which matrix dislocations could be incorporated into the interface to relieve coherency strains. Thus alloys with a negative misfit (ie. the γ' lattice parameter was smaller than the matrix) could lose coherency easily and γ/γ' interfaces would exhibit regularly spaced networks of dislocations, as shown in figure 1 for the case of Nimonic 115 (misfit = -0.15%). In contrast, γ' particles in alloys with a positive misfit could grow to a large size and not show any such dislocation arrangements in the interface, thus indicating that coherency had not been lost. Figure 2 depicts a large γ' precipitate in Nimonic 80A (misfit = +0.32%) showing few interfacial dislocations.

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Automatic analysis of Kikuchi diffraction patterns

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100172231 ◽

1994 ◽

Vol 52 ◽

pp. 900-901

Author(s):

H. Weiland ◽

D. P. Field

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Spatial Resolution ◽

Relevant Information ◽

Crystalline Materials ◽

Large Size ◽

Transmission Electron ◽

New Type ◽

Diffraction Patterns ◽

Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

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