Detection of Stress Shielding Effect at Elevated Temperature in Silicon Nitride Using Digital Image Correlation Method
2002 ◽
Vol 2002.2
(0)
◽
pp. 173-174
◽
2002 ◽
Vol 2002.77
(0)
◽
pp. _2-37_-_2-38_
2020 ◽
Vol 12
(02)
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2021 ◽
pp. 1-22
2021 ◽
2021 ◽
2018 ◽
Vol 64
(5)
◽
pp. 566-577
◽