Detection of Stress Shielding Effect at Elevated Temperature in Silicon Nitride Using Digital Image Correlation Method

2002 ◽  
Vol 2002.2 (0) ◽  
pp. 173-174 ◽  
Author(s):  
Izuru NISHIKAWA ◽  
Keiji OGURA ◽  
Shinya KUNIMATSU
2009 ◽  
Vol 34 (13) ◽  
pp. 1955 ◽  
Author(s):  
Min Wang ◽  
Hao Wang ◽  
Yuwan Cen

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