STATISTICAL AND NEURAL METHODS FOR SITE–SPECIFIC YIELD PREDICTION

2003 ◽  
Vol 46 (1) ◽  
Author(s):  
S. T. Drummond ◽  
K. A. Sudduth ◽  
A. Joshi ◽  
S. J. Birrell ◽  
N. R. Kitchen
1999 ◽  
Vol 21 (2) ◽  
pp. 120
Author(s):  
Jeffrey A. Behme ◽  
Jack L. Schinstock ◽  
Leonard L. Bashford ◽  
Louis I. Leviticus
Keyword(s):  

2014 ◽  
Vol 16 (4) ◽  
pp. 361-384 ◽  
Author(s):  
Benjamin Dumont ◽  
Bruno Basso ◽  
Vincent Leemans ◽  
Bernard Bodson ◽  
Jean-Pierre Destain ◽  
...  

Agronomy ◽  
2020 ◽  
Vol 10 (5) ◽  
pp. 631 ◽  
Author(s):  
Hao Xu ◽  
Fen Huang ◽  
Wenjun Zuo ◽  
Yongchao Tian ◽  
Yan Zhu ◽  
...  

Simulations based on site-specific crop growth models have been widely used to obtain regional yield potential estimates for food security assessments at the regional scale. By dividing a region into nonoverlapping basic spatial units using appropriate zonation schemes, the data required to run a crop growth model can be reduced, thereby improving the simulation efficiency. In this study, we explored the impacts of different zonation schemes on estimating the regional yield potential of the Chinese winter wheat area to obtain the most appropriate spatial zonation scheme of weather sites therein. Our simulated results suggest that the upscaled site-specific yield potential is affected by the zonation scheme and by the spatial distribution of sites. As such, the distribution of a small number of sites significantly affected the simulated regional yield potential under different zonation schemes, and the zonation scheme based on sunshine duration clustering zones could effectively guarantee the simulation accuracy at the regional scale. Using the most influential environmental variable of crop growth models for clustering can get the better zonation scheme to upscale the site-specific simulation results. In contrast, a large number of sites had little effect on the regional yield potential simulation results under the different zonation schemes.


Author(s):  
Guoqi Wen ◽  
Bao-Luo Ma ◽  
Anne Vanasse ◽  
Claude D. Caldwell ◽  
Hugh J. Earl ◽  
...  

1987 ◽  
Vol 67 (4) ◽  
pp. 731-745 ◽  
Author(s):  
L. A. BATTISTON ◽  
M. H. MILLER ◽  
I. J. SHELTON

Yield of corn (Zea mays L.) was measured at eight sites in 1982 and nine sites in 1983 on areas in farm fields exhibiting differing degrees of past erosion. Yield was also measured on depositional areas in some fields. Yield on depositional areas was, on average, marginally greater than on noneroded areas. Yield on severely eroded areas (all or most of original solum lost) ranged from 16 to 80% of that on noneroded areas with an average of 59%. There was little or no reduction in yield until the depth to Ck had been reduced to almost 50% of that on the noneroded profile. With further reductions in depth to Ck, yields declined rapidly on most sites. The primary cause of yield reduction varied from site to site and included reduced stand and seedling vigor due to a poor seedbed condition, nutrient deficiency and reduced available water holding capacity (AWHC). The impact of erosion on yield at a field and regional level was estimated based on the extent of erosion determined from aerial photographs and the site-specific yield measurements. Estimated corn yield on two fields was about 92% of that expected if no erosion had occurred. In a 90-km2 area of the Regional Municipality of Waterloo, 18% of the cultivated land was estimated to be moderately to severely eroded. Based on the site-specific yield measurements, this erosion would result in a 3.6% reduction in average corn yield in the region. The implications of the findings on preventative and remedial measures and on future productivity in the region are discussed. Key words: Erosion, yield, corn, seedbed condition, nutrient deficiency, water stress


2006 ◽  
Vol 88 (2) ◽  
pp. 471-483 ◽  
Author(s):  
Yanyan Liu ◽  
Scott M. Swinton ◽  
Neil R. Miller

2005 ◽  
Vol 6 (1) ◽  
pp. 41-51 ◽  
Author(s):  
S. Norng ◽  
A. N. Pettitt ◽  
R. M. Kelly ◽  
D. G. Butler ◽  
W. M. Strong

2002 ◽  
Vol 27 (3) ◽  
pp. 233-245 ◽  
Author(s):  
David S. Bullock ◽  
Jess Lowenberg-DeBoer ◽  
Scott M. Swinton

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