Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data

2003 ◽  
Vol 51 (3) ◽  
pp. 293-300 ◽  
Author(s):  
Chao Shang ◽  
James A. Rice ◽  
Dennis D. Eberl ◽  
Jar-Shyong Lin
Nano Research ◽  
2019 ◽  
Vol 12 (11) ◽  
pp. 2849-2857 ◽  
Author(s):  
Julian Cedric Porsiel ◽  
Bilal Temel ◽  
Alfred Schirmacher ◽  
Egbert Buhr ◽  
Georg Garnweitner

2018 ◽  
Vol 122 (45) ◽  
pp. 10320-10329 ◽  
Author(s):  
Amin Sadeghpour ◽  
Marjorie Ladd Parada ◽  
Josélio Vieira ◽  
Megan Povey ◽  
Michael Rappolt

2020 ◽  
Vol 124 (25) ◽  
pp. 5186-5200 ◽  
Author(s):  
Milka Doktorova ◽  
Norbert Kučerka ◽  
Jacob J. Kinnun ◽  
Jianjun Pan ◽  
Drew Marquardt ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document