Optical characterization of a four-medium thin film structure by real time spectroscopic ellipsometry: amorphous carbon on tantalum

1991 ◽  
Vol 30 (19) ◽  
pp. 2692 ◽  
Author(s):  
Yue Cong ◽  
IIsin An ◽  
K. Vedam ◽  
Robert W. Collins
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Amorphous Carbon ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Film Structure ◽  
Thin Film Structure

Characterization of amorphous carbon nitride by bottom-gated thin-film structure

2006 ◽  
Vol 15 (4-8) ◽  
pp. 1015-1018 ◽  
Author(s):  
Yasuhiko Hayashi ◽  
N. Kamada ◽  
T. Soga ◽  
T. Jimbo
Keyword(s):  
Thin Film ◽  
Amorphous Carbon ◽  
Carbon Nitride ◽  
Film Structure ◽  
Thin Film Structure ◽  
Amorphous Carbon Nitride

Real‐time optical characterization of surface acoustic modes of polyimide thin‐film coatings

1992 ◽  
Vol 72 (7) ◽  
pp. 2823-2839 ◽  
Author(s):  
Anil R. Duggal ◽  
John A. Rogers ◽  
Keith A. Nelson
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Optical Characterization ◽  
Film Coatings ◽  
Acoustic Modes ◽  
Thin Film Coatings

Surface Characterization of Irradiated Zno:Al Thin Film by Reactor Neutrons

2013 ◽  
Vol 334-335 ◽  
pp. 294-296 ◽  
Author(s):  
N. Baydogan ◽  
K. Çilingiryan ◽  
A.B. Tugrul ◽  
Huseyin Cimenoglu ◽  
S.S. Yeşilkaya
Keyword(s):  
Thin Film ◽  
Electrical Resistivity ◽  
Surface Characterization ◽  
Film Structure ◽  
Thin Film Structure

rradiation of ZnO:Al thin film by reactor neutrons with neutron/gamma ratio at 1.44x104 (n.cm-2.s-1.mR-1) leads to a decrease in resistivity in this material. The observed effects in electrical resistivity are attributed to irradiation-induced formation of defects in the ZnO:Al thin film structure.

Characterization of aluminium nitride thin film structure using second-harmonic generation

1994 ◽  
Vol 3 (1) ◽  
pp. 41-45 ◽  
Author(s):  
D. Blanc ◽  
A. Cachard ◽  
J.C. Pommier ◽  
J.F. Roux ◽  
J.L. Coutaz
Keyword(s):  
Thin Film ◽  
Second Harmonic Generation ◽  
Harmonic Generation ◽  
Second Harmonic ◽  
Film Structure ◽  
Aluminium Nitride ◽  
Thin Film Structure
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