Characterization of Wide Bandgap Thin Film Growth Using UV-Extended Real Time Spectroscopic Ellipsometry: Applications to Cubic Boron Nitride
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1999 ◽
Vol 66
(1-3)
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pp. 79-82
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1991 ◽
pp. 33-40
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2002 ◽
Vol 20
(4)
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pp. 1395-1407
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2012 ◽
Vol 22
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pp. 88-91
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2001 ◽
Vol 87
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pp. 1-22
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