Design of highly sensitive refractive index sensors in the visible region utilizing metal layer assisted guided modes

2021 ◽  
Author(s):  
Vipul Pandey ◽  
Suchandan Pal
Sensors ◽  
2020 ◽  
Vol 20 (21) ◽  
pp. 6199
Author(s):  
Madina Shaimerdenova ◽  
Takhmina Ayupova ◽  
Marzhan Sypabekova ◽  
Daniele Tosi

In this work, we introduced fabrication and interrogation of simple and highly sensitive fiber-optic refractive index (RI) sensors based on ball resonators built on the tip of single-mode fibers. The probes have been fabricated through a CO2 fiber splicer, with a fast (~600 s) and repeatable method. The ball resonator acted as a weak interferometer with a return loss below −50 dB and was interrogated with an optical backscatter reflectometer measuring the reflection spectrum. The ball resonators behaved as weak interferometers with a shallow fringe and a spectrum that appeared close to a random signal, and RI sensitivity could be measured either through wavelength shift or amplitude change. In this work, we reported four samples having sensitivity ranges 48.9–403.3 nm/RIU and 256.0–566.2 dB/RIU (RIU = refractive index unit). Ball resonators appeared as a sensitive and robust platform for RI sensing in liquid and can be further functionalized for biosensing.


ACS Sensors ◽  
2018 ◽  
Vol 3 (5) ◽  
pp. 960-966 ◽  
Author(s):  
Martin Mesch ◽  
Thomas Weiss ◽  
Martin Schäferling ◽  
Mario Hentschel ◽  
Ravi S. Hegde ◽  
...  

2017 ◽  
Vol 25 (5) ◽  
pp. 5352 ◽  
Author(s):  
Huazhuo Dong ◽  
Liheng Chen ◽  
Junjie Zhou ◽  
Jianhui Yu ◽  
Heyuan Guan ◽  
...  

2005 ◽  
Vol 86 (15) ◽  
pp. 151122 ◽  
Author(s):  
Wei Liang ◽  
Yanyi Huang ◽  
Yong Xu ◽  
Reginald K. Lee ◽  
Amnon Yariv

2015 ◽  
Vol 119 (10) ◽  
pp. 5577-5582 ◽  
Author(s):  
Janak Prasad ◽  
Inga Zins ◽  
Robert Branscheid ◽  
Jan Becker ◽  
Amelie H. R. Koch ◽  
...  

2017 ◽  
Vol 137 (11) ◽  
pp. 415-416 ◽  
Author(s):  
Tomoki Shimizu ◽  
Yoshiaki Kanamori ◽  
Kazuhiro Hane

2019 ◽  
Vol 806 ◽  
pp. 24-29 ◽  
Author(s):  
Olga V. Volovlikova ◽  
S.A. Gavrilov ◽  
P.I. Lazarenko ◽  
A.V. Kukin ◽  
A.A. Dudin ◽  
...  

This paper examines the influence of etching regimes on the reflectance of black silicon formed by Ni-assisted chemical etching. Black silicon exhibits properties of high light absorptance. The measured minimum values of the reflectance (R-min) of black silicon with thickness of 580 nm formed by metal-assisted chemical etching (MACE) for 60 minutes at 460 lx illumination were 2,3% in the UV region (200–400 nm), 0,5% in the visible region (400–750 nm) and 0,3% in the IR region (750–1300 nm). The findings showed that the reflectance of black silicon depends on its thickness, illumination and treatment duration. In addition, the porosity and refractive index were calculated.


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