Dynamic deformation measurement of dual-wavelength random phase-shifting digital holography with automatic phase-shift detection

2021 ◽  
Author(s):  
Peng Xia ◽  
Shien Ri ◽  
Qinghua Wang
Keyword(s):  
Phase Shift ◽  
Digital Holography ◽  
Dynamic Deformation ◽  
Random Phase ◽  
Deformation Measurement ◽  
Phase Shifting ◽  
Dual Wavelength ◽  
Automatic Phase ◽  
Shift Detection

Dual-wavelength random-phase-shift interferometer for phasing large segmented primaries

1998 ◽  
Author(s):  
Kjetil Dohlen ◽  
Frederique Decortiat ◽  
Francois Fresneau ◽  
Patrick Lanzoni
Keyword(s):  
Phase Shift ◽  
Random Phase ◽  
Dual Wavelength

Determination of Phase Shift by Digital Holography

2019 ◽  
Vol 888 ◽  
pp. 43-46
Author(s):  
Yoshitaka Takahashi ◽  
Masatoshi Saito ◽  
Toru Nakajima ◽  
Masakazu Shingu
Keyword(s):  
Phase Shift ◽  
Noise Reduction ◽  
Digital Holography ◽  
High Accuracy ◽  
Measured Data ◽  
Phase Shifting ◽  
Surface Shape ◽  
Shape Measurement ◽  
Phase Shifting Interferometry

In phase shifting interferometry phase shift is applied by various ways, but applying it with high accuracy, especially by LD current modulation, is not easy. In order to determine the accurate phase shift a new method has been proposed that the value of LD current corresponding to π/2 phase shift can be determined by phase shifting digital holography. The measured data of standard in surface shape measurement were used for calibration, and the obtained value was confirmed to cause noise reduction and improvement of holographic reconstructed images in digital holography.

A method of hard X-ray phase-shifting digital holography

2016 ◽  
Vol 23 (4) ◽  
pp. 1024-1029
Author(s):  
So Yeong Park ◽  
Chung Ki Hong ◽  
Jun Lim
Keyword(s):  
Phase Shift ◽  
Digital Holography ◽  
Relative Phase ◽  
Test Pattern ◽  
Fresnel Lens ◽  
Phase Shifting ◽  
New Method ◽  
Phase Plate ◽  
X Ray ◽  
Line Type

A new method of phase-shifting digital holography is demonstrated in the hard X-ray region. An in-line-type phase-shifting holography setup was installed in a 6.80 keV hard X-ray synchrotron beamline. By placing a phase plate consisting of a hole and a band at the focusing point of a Fresnel lens, the relative phase of the reference and objective beams could be successfully shifted for use with a three-step phase-shift algorithm. The system was verified by measuring the shape of a gold test pattern and a silica sphere.

Deformation measurement by phase-shifting digital holography

2005 ◽  
Vol 45 (1) ◽  
pp. 65-70 ◽  
Author(s):  
Y. Morimoto ◽  
T. Nomura ◽  
M. Fujigaki ◽  
S. Yoneyama ◽  
I. Takahashi
Keyword(s):  
Digital Holography ◽  
Deformation Measurement ◽  
Phase Shifting

scholarly journals Nanometer-order thermal deformation measurement by a calibrated phase-shifting digital holography system

2018 ◽  
Vol 26 (10) ◽  
pp. 12594 ◽  
Author(s):  
Peng Xia ◽  
Shien Ri ◽  
Qinghua Wang ◽  
Hiroshi Tsuda
Keyword(s):  
Thermal Deformation ◽  
Digital Holography ◽  
Deformation Measurement ◽  
Phase Shifting
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