Analysis of the resolution-bandwidth-noise trade-off in wavelength-based photonic analog-to-digital converters

Johan Stigwall; Sheila Galt

doi:10.1364/ao.45.004310

Analysis of the resolution-bandwidth-noise trade-off in wavelength-based photonic analog-to-digital converters

Applied Optics ◽

10.1364/ao.45.004310 ◽

2006 ◽

Vol 45 (18) ◽

pp. 4310 ◽

Cited By ~ 3

Author(s):

Johan Stigwall ◽

Sheila Galt

Keyword(s):

Analog To Digital Converters ◽

Trade Off ◽

Analog To Digital ◽

Resolution Bandwidth

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Speed-Power-Accuracy Trade-off In high-speed Analog-to-digital converters: Now and in the future...

Analog Circuit Design ◽

10.1007/978-1-4757-3198-9_1 ◽

2000 ◽

pp. 3-24 ◽

Cited By ~ 5

Author(s):

M. Steyaert ◽

K. Uyttenhove

Keyword(s):

High Speed ◽

Analog To Digital Converters ◽

Trade Off ◽

Analog To Digital ◽

The Future

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Trade-off between antialiasing filter and analog-to-digital converters specifications in homodyne radio frequency receivers

IEEE 54th Vehicular Technology Conference. VTC Fall 2001. Proceedings (Cat. No.01CH37211) ◽

10.1109/vtc.2001.957169 ◽

2002 ◽

Cited By ~ 3

Author(s):

E. Colin ◽

L. Naviner ◽

P. Loumeau ◽

J.-F. Naviner

Keyword(s):

Radio Frequency ◽

Analog To Digital Converters ◽

Trade Off ◽

Analog To Digital ◽

Radio Frequency Receivers

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Analog-to-Digital Converters Employing Chaotic Internal Circuits to Maximize Resolution-Bandwidth Product - Turbo ADC

Understanding Complex Systems - Proceedings of the 5th International Conference on Applications in Nonlinear Dynamics ◽

10.1007/978-3-030-10892-2_20 ◽

2019 ◽

pp. 199-210

Author(s):

Zeljko Ignjatovic ◽

Yiqiao Zhang

Keyword(s):

Analog To Digital Converters ◽

Analog To Digital ◽

Resolution Bandwidth

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Analysis of the trade-off between bandwidth, resolution, and power in ΔΣ analog to digital converters

1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196) ◽

10.1109/icecs.1998.814853 ◽

2002 ◽

Cited By ~ 3

Author(s):

A. Marques ◽

V. Peluso ◽

M. Steyaert ◽

W. Sansen

Keyword(s):

Analog To Digital Converters ◽

Trade Off ◽

Analog To Digital

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On the Signature Analysis of Analog-to-Digital Converters

i-manager’s Journal on Software Engineering ◽

10.26634/jse.4.3.1117 ◽

2010 ◽

Vol 4 (3) ◽

pp. 44-49

Author(s):

Vadim Geurkov ◽

L. Kirischian

Keyword(s):

Analog To Digital Converters ◽

Signature Analysis ◽

Analog To Digital

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MODELING OF ANALOG-TO-DIGITAL CONVERTERS IN THE MULTISIM

CAD/EDA, MODELING AND SIMULATION IN MODERN ELECTRONICS: COLLECTION OF SCIENTIFIC PAPERS OF THE III INTERNATIONAL SCIENTIFIC AND PRACTICAL CONFERENCE ◽

10.30987/conferencearticle_5e0282150b0a94.52925909 ◽

2019 ◽

Author(s):

Aleksandr Shtin

Keyword(s):

Electronic Devices ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Functional Units

The report examined the features of modeling in Multisim such functional units of electronic devices as analog-to-digital converters.

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An ICA Framework for Digital Background Calibration of Analog-to-Digital Converters

Sampling Theory, Signal Processing, and Data Analysis ◽

10.1007/bf03549557 ◽

2012 ◽

Vol 11 (2-3) ◽

pp. 253-270

Author(s):

Yun Chiu ◽

Seung-Chul Lee ◽

Wenbo Liu

Keyword(s):

Analog To Digital Converters ◽

Background Calibration ◽

Analog To Digital ◽

Digital Background Calibration

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Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2010575 ◽

2009 ◽

Vol 58 (4) ◽

pp. 786-790 ◽

Cited By ~ 10

Author(s):

R. Iuzzolino ◽

L. Palafox ◽

W.G. Kurten Ihlenfeld ◽

E. Mohns ◽

C. Brendel

Keyword(s):

Analog To Digital Converters ◽

Sampling System ◽

Sigma Delta ◽

Analog To Digital

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Phase-plane characterization of analog-to-digital converters

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

10.1109/imtc.2004.1351105 ◽

2004 ◽

Cited By ~ 1

Author(s):

C.L. Monteiro ◽

P. Arpaia ◽

A.C. Serra

Keyword(s):

Phase Plane ◽

Analog To Digital Converters ◽

Analog To Digital

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A new method for testing the effective number of bits of analog to digital converters

1996 IEEE Nuclear Science Symposium. Conference Record ◽

10.1109/nssmic.1996.591036 ◽

2002 ◽

Author(s):

J. Basilio Simoes ◽

C.F.M. Loureiro ◽

J. Landeck ◽

C.M.B.A. Correia

Keyword(s):

Analog To Digital Converters ◽

New Method ◽

Effective Number ◽

Analog To Digital

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