Absorption measurements in optical coatings by lock-in thermography

2017 ◽  
Vol 56 (33) ◽  
pp. 9225 ◽  
Author(s):  
Feng Liu ◽  
Laurent Gallais
2009 ◽  
Vol 7 (11) ◽  
pp. 1061-1064 ◽  
Author(s):  
陶春先 Chunxian Tao ◽  
赵元安 Yuanan Zhao ◽  
贺洪波 Hongbo He ◽  
李大伟 Dawei Li ◽  
邵建达 Jianda Shao ◽  
...  

2021 ◽  
Author(s):  
Camille Petite ◽  
Remi Marcouille ◽  
Antonin Moreau ◽  
Hélène Krol ◽  
Catherine Grezes-Besset ◽  
...  

Coatings ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 473 ◽  
Author(s):  
Simon Bublitz ◽  
Christian Mühlig

Absolute measurement of residual absorption in optical coatings is steadily becoming more important in thin film characterization, in particular with respect to high power laser applications. A summary is given on the current ability of the laser induced deflection (LID) technique to serve sensitive photo-thermal absorption measurements combined with reliable absolute calibration based on an electrical heater approach. To account for different measurement requirements, several concepts have been derived to accordingly adapt the original LID concept. Experimental results are presented for prominent UV and deep UV laser wavelengths, covering a variety of factors that critically can influence the absorption properties in optical coatings e.g., deposition process, defects and impurities, intense laser irradiation and surface/interface engineering. The experimental findings demonstrate that by combining high sensitivity with absolute calibration, photo-thermal absorption measurements are able to be a valuable supplement for the characterization of optical thin films and coatings.


2009 ◽  
Vol 29 (8) ◽  
pp. 2333-2337
Author(s):  
陶春先 Tao Chunxian ◽  
赵元安 Zhao Yuan′an ◽  
贺洪波 He Hongbo ◽  
邵建达 Shao Jianda

2014 ◽  
Vol 85 (3) ◽  
pp. 033103 ◽  
Author(s):  
Paulino Vacas-Jacques ◽  
Jacqueline Linnes ◽  
Anna Young ◽  
Victoria Gerrard ◽  
Jose Gomez-Marquez

1995 ◽  
Vol 7 (1) ◽  
pp. 215-228 ◽  
Author(s):  
J. Rantala ◽  
D. Wu ◽  
G. Busse
Keyword(s):  

1982 ◽  
Vol 43 (5) ◽  
pp. 755-759 ◽  
Author(s):  
M. Bertault ◽  
M. Krauzman ◽  
M. Le Postollec ◽  
R.M. Pick ◽  
M. Schott

2012 ◽  
Vol 132 (11) ◽  
pp. 1033-1038
Author(s):  
Yuichiro Kai ◽  
Yuji Tsuchida ◽  
Takashi Todaka ◽  
Masato Enokizono

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