Generation and Characterization of Attosecond Pulses from an X-ray Free-electron Laser

Author(s):  
Siqi Li ◽  
Philipp Rosenberger ◽  
Elio G. Champenois ◽  
Taran Driver ◽  
Philip H. Bucksbaum ◽  
...  
2015 ◽  
Vol 22 (1) ◽  
pp. 10-15 ◽  
Author(s):  
Simon G. Alcock ◽  
Ioana Nistea ◽  
John P. Sutter ◽  
Kawal Sawhney ◽  
Jean-Jacques Fermé ◽  
...  

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the `junction effect': a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts.


2020 ◽  
Vol 27 (5) ◽  
pp. 1366-1371
Author(s):  
Nami Nakamura ◽  
Satoshi Matsuyama ◽  
Takato Inoue ◽  
Ichiro Inoue ◽  
Jumpei Yamada ◽  
...  

This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged.


2013 ◽  
Vol 3 (1) ◽  
Author(s):  
Andreas Schropp ◽  
Robert Hoppe ◽  
Vivienne Meier ◽  
Jens Patommel ◽  
Frank Seiboth ◽  
...  

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