Angular reflectance of a highly forward scattering medium at grazing incidence of light

It is quite simple (in the transmission electron microscope) to obtain convergent-beam patterns from the surface of a bulk crystal. The beam is focussed onto the surface at near grazing incidence (figure 1) and if the surface is flat the appropriate pattern is obtained in the diffraction plane (figure 2). Such patterns are potentially valuable for the characterization of surfaces just as normal convergent-beam patterns are valuable for the characterization of crystals.There are, however, several important ways in which reflection diffraction from surfaces differs from the more familiar electron diffraction in transmission.GeometryIn reflection diffraction, because of the surface, it is not possible to describe the specimen as periodic in three dimensions, nor is it possible to associate diffraction with a conventional three-dimensional reciprocal lattice.

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Study of photon propagation in a liquid scattering medium

Journal de Chimie Physique ◽

10.1051/jcp/1997940251 ◽

1997 ◽

Vol 94 ◽

pp. 251-256 ◽

Cited By ~ 1

Author(s):

S Marengo ◽

C Pépin ◽

D Houde

Keyword(s):

Scattering Medium ◽

Photon Propagation

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DYNAMICAL X-RAY DIFFRACTION FROM CRYSTALS UNDER GRAZING-INCIDENCE CONDITIONS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1989724 ◽

1989 ◽

Vol 50 (C7) ◽

pp. C7-225-C7-229

Author(s):

H. HASHIZUME ◽

O. SAKATA

Keyword(s):

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray

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New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

MRS Proceedings ◽

10.1557/proc-628-cc8.3 ◽

2000 ◽

Vol 628 ◽

Author(s):

Sophie Besson ◽

Catherine Jacquiod ◽

Thierry Gacoin ◽

André Naudon ◽

Christian Ricolleau ◽

...

Keyword(s):

Cetyltrimethylammonium Bromide ◽

Grazing Incidence ◽

Hexagonal Structure ◽

X Ray Diffraction ◽

Electronic Microscopy ◽

Silica Films ◽

X Ray ◽

X Ray Scattering ◽

Hexagonal Arrangement ◽

Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

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