Study of the electro-optical transformation of linearly polarized Bessel beams propagating along the optic axis of an anisotropic DKDP crystal

Wide-angle convergent beam shadow images(CBSI) exhibit several characteristic distortions resulting from spherical aberration. The most prominent is a circle of infinite magnification resulting from rays having equal values of a forming a cross-over on the optic axis at some distance before reaching the paraxial focal point. This distortion is called the tangential circle of infinite magnification; it can be used to align and stigmate a STEM and to determine Cs for the probe forming lens. A second distortion, the radial circle of infinite magnification, results from a cross-over on the lens caustic surface of rays with differing values of ∝a, also before the paraxial focal point of the lens.

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Resolving Crystallites in Zirconium Oxide Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062610 ◽

1969 ◽

Vol 27 ◽

pp. 140-141

Author(s):

R.A. Ploc

Keyword(s):

Electron Microscope ◽

Inelastic Scattering ◽

Zirconium Oxide ◽

Oxide Films ◽

Optic Axis ◽

Objective Lens ◽

Microscope Objective ◽

Linear Optic ◽

A Current ◽

Microscope Objective Lens

The optic axis of an electron microscope objective lens is usually assumed to be straight and co-linear with the mechanical center. No reason exists to assume such perfection and, indeed, simple reasoning suggests that it is a complicated curve. A current centered objective lens with a non-linear optic axis when used in conjunction with other lenses, leads to serious image errors if the nature of the specimen is such as to produce intense inelastic scattering.

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Experiments in Bright-Field Imaging with Hollow-Cone Illumination

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100097703 ◽

1981 ◽

Vol 39 ◽

pp. 226-227

Author(s):

W. Kunath ◽

K. Weiss ◽

E. Zeitler

Keyword(s):

Signal To Noise Ratio ◽

Carbon Support ◽

Electronic System ◽

Optic Axis ◽

Hollow Cone ◽

Signal To Noise ◽

Bright Field ◽

Noise Ratio ◽

Single Field ◽

Field Imaging

Bright-field images taken with axial illumination show spurious high contrast patterns which obscure details smaller than 15 ° Hollow-cone illumination (HCI), however, reduces this disturbing granulation by statistical superposition and thus improves the signal-to-noise ratio. In this presentation we report on experiments aimed at selecting the proper amount of tilt and defocus for improvement of the signal-to-noise ratio by means of direct observation of the electron images on a TV monitor.Hollow-cone illumination is implemented in our microscope (single field condenser objective, Cs = .5 mm) by an electronic system which rotates the tilted beam about the optic axis. At low rates of revolution (one turn per second or so) a circular motion of the usual granulation in the image of a carbon support film can be observed on the TV monitor. The size of the granular structures and the radius of their orbits depend on both the conical tilt and defocus.

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