CBED Shadow Images and Cs:Aberration Measurement

Author(s):  
R. W. Carpenter ◽  
I.Y.T. Chan ◽  
J. M. Cowley

Wide-angle convergent beam shadow images(CBSI) exhibit several characteristic distortions resulting from spherical aberration. The most prominent is a circle of infinite magnification resulting from rays having equal values of a forming a cross-over on the optic axis at some distance before reaching the paraxial focal point. This distortion is called the tangential circle of infinite magnification; it can be used to align and stigmate a STEM and to determine Cs for the probe forming lens. A second distortion, the radial circle of infinite magnification, results from a cross-over on the lens caustic surface of rays with differing values of ∝a, also before the paraxial focal point of the lens.

Author(s):  
R.A. Herring ◽  
G. Pozzi ◽  
T. Tanji ◽  
A. Tonomura

Recently, a new method of interferometry has been realized which is capable of providing important information of crystals, crystal defects and electron-optical information of the microscope such as its spherical aberration surface. The method produces interferograms by using an electron biprism to interfere diffracted beams produced from a small convergent beam probe of ∼10 nm. The electron biprism uses an applied voltage of ∼15 to 100 V to deflect and compensate for the diffracted beam(s) of 2θB (typically ∼5 mrad) (Fig. 1). The biprism ∼0.3 μm dia) is inserted in between and perpendicular to the diffracted beam(s). Two biprism positions were successfully used. An “upper” biprism is placed in the selected area aperture position which is between the objective lens and 1st intermediate lens. A “lower” biprism is further down the optic axis and is placed between the 1st and 2nd intermediate lenses. In Fig. 1, the virtual image of a biprism is shown with respect to the specimen plane.


1985 ◽  
Vol 56 ◽  
Author(s):  
D. CHERNS ◽  
C.J. KIELY

AbstractThe use of convergent beam electron diffraction patterns (CBPs) for investigating metal—semiconductor interfaces in plan—view samples is considered. It is shown that a wide—angle diffraction technique provides a sensitive method of measuring tetragonal distortions in NiSi 2/(001)Si bicrystals. A study of CBP symmetry and the detailec branch structure in higher order Laue zone rings has enabled the interfacial rigid body displacement in NiSi 2/(001)Si and Al/(001)GaAs films to be determined.


2011 ◽  
Vol 17 (6) ◽  
pp. 859-865 ◽  
Author(s):  
Vineet Kumar

AbstractThe grain size statistics, commonly derived from the grain map of a material sample, are important microstructure characteristics that greatly influence its properties. The grain map for nanomaterials is usually obtained manually by visual inspection of the transmission electron microscope (TEM) micrographs because automated methods do not perform satisfactorily. While the visual inspection method provides reliable results, it is a labor intensive process and is often prone to human errors. In this article, an automated grain mapping method is developed using TEM diffraction patterns. The presented method uses wide angle convergent beam diffraction in the TEM. The automated technique was applied on a platinum thin film sample to obtain the grain map and subsequently derive grain size statistics from it. The grain size statistics obtained with the automated method were found in good agreement with the visual inspection method.


Author(s):  
A. Higgs ◽  
O. L. Krivanek

Wide angle zone axis patterns (ZAPs) have been acquired by the rock-unrock method by Eades in a Philips 400 and by Tanaka et al. in a JEM 100CX. Tanaka et al. used one set of coils before the specimen for rocking and one after the specimen for unrocking. Although this was sufficient to make the beam stationary at the detector, it did not bring it back parallel to the optic axis. Eades used two sets of coils both before and after the specimen and achieved complete de-scanning as well as complete de-rocking.When the ZAPs are to be energy filtered it is important that the beam enter the spectrometer on axis. We have therefore followed Eades' approach and used two sets of coils before the specimen (coils IA, IB) to rock the beam about a stationary point on the specimen (Fig. 1), and two sets of coils after the specimen (IIA, IIB) to de-rock the beam in a precisely reciprocal arrangement.


Author(s):  
Shiyao Wang ◽  
M. Gajdardziska-Josifovska ◽  
J.M. Cowley

The properties of multilayer thin film materials are strongly influenced by the structure of their interfaces. The numerous applications for these materials motivate electron microscopy studies of cross sectional samples in which the interfaces are observed edge on. High resolution imaging is the most established technique, but other techniques, such as Fresnel fringe method and refraction at interfaces, have also been employed to characterize the structure and abruptness of amorphous/polycrystalline multilayers. The aim of this work is to explore the applicability of shadow images from coherent sources to the studies of multilayers.Coherent interference effects are readily observable in the diffraction plane of a VG HB-5 STEM which is equipped with a cold field emission gun. The shadow image of the studied Si/Mo multilayer is obtained on the detection plane when the specimen is illuminated by a stationary convergent beam. This beam is formed with a very large or no objective aperture. Low magnification images are produced at large values of defocus (Fig. 1a), while for lower defocus the magnification increases and the shadow images become more and more distorted because of the objective lens aberration (Fig. 1b and 1c). In addition to the high sensitivity to the defocus. spherical aberration and probe position, the shadow images also appear to be dependent on the interface abruptness.


Superposition-image quality in the clear-zone eye depends in the first instance on the optical characteristics of the lens elements in each ommatidium. The optical design strategy of the two lens elements, a thick corneal facet and an underlying crystalline cone, in the scarab eye is reported. The formation of a good superposition image at the rhabdom layer in the eye demands that the lens elements be precisely arrayed, virtually free of optical aberrations, and that each lens pair function as an afocal (telescopic) lens system with an internal intermediate focal plane. The optical properties of the corneal facet were examined by a variety of means. The isolated corneas of most scarab species focused good quality images of a distant object. Cardinal-point analysis of the intact corneal lens revealed that the back focal point of the lens lies just proximal to the inner corneal surface, many micrometres distal to the rhabdom layer, and the position of the principal planes suggested that the corneal lens had internal lens-cylinder properties. This was confirmed by the examination of the focusing power of transverse lens slices of known thickness; the power of the corneal lens slice was a function of its thickness. Interference refractometry of corneal sections revealed that the facet is a graded-refractive-index (g.r.i.) lens in the great majority of more than 40 scarab species examined. The position of the back focal point is achieved in a thick corneal lens by (i) the presence of a g.r.i. lens, best developed in the proximal corneal region, where it consists of a g.r.i. lens cylinder capped by a g.r.i. lens hemisphere, and (ii) the loss of front facet curvature in the homogeneous distal corneal region. In situ , the back focal point lies deep within the crystalline cone. Since the quality of the superposition image depends on the exact location of the intermediate-image plane in the crystalline cone, this position was determined from a comparative analysis of cone shape, experimental observations, and theoretical modelling of the cone. Four observations, namely the presence of a waist in the crystalline cone of many species, the back focal distance of the isolated cornea when the refractive index (r.i.) of the medium in the back focal space approximated that situ, the presence of screening pigment around specific regions of the crystalline cone and the position of the intermediate-image plane in the exocone of a passalid beetle eye, all suggested that the intermediate focus lies in the waist region. The proximal region of the crystalline cone was modelled on the basis of its known g.r.i. lens properties. The model used comprised a radial g.r.i. lens cylinder with a parabolic profile in r.i., terminating in a g.r.i. lens hemiellipsoid. Dimensions and r.i. distribution in the model were based on values from real cones. The model cone focused an incident parallel beam to a point within the cone corresponding to the waist region in real cones. For beams at angles as great as 20° to the optic axis, aberrations in the model cone are small, and restricted to the most peripheral rays. A homogeneous hemiellipse of similar dimensions has severe aberrations for beams at an angle to the optic axis. The model predicts that the ommatidial optics are diffraction-limited; the spread of rays leaving the proximal cone tip due to diffraction at the small exit aperture of the cone (for all aperture diameters) is broader than that due to lens aberrations. Consequently, tolerance exists to optical imperfections in the lens components and their spacing. A tolerance in the position of the intermediate focal plane of + 2-3 pm was calculated. Lens design is strongly correlated with the daily activity pattern of the scarab species under consideration. The corneal facets of nocturnal and crepuscular species are wide with little individual facet curvature; such ‘glacial’ corneas are completely transparent. The crystalline cone is large and well developed. In diurnal species, the corneal facets are narrower, with strong individual curvature, and the corneal lens cylinders are often lined with a brown screening pigment. The crystalline cones of diurnal scarabs are frequently strongly waisted or greatly reduced in size. Pigment surrounding the cone waist serves as a field stop limiting the angular acceptance of the ommatidial optics. The waist limits the number of ommatidia that can contribute to the superposition image and therefore determines the maximum aperture of the eye. This aperture is greatest in nocturnal species with little or no waist constriction in the crystalline cone. Most scarab clear-zone eyes are of the eucone type (separate crystalline cone). However, in the Passalidae and bolboceratine and pleocomine Geotrupidae, the crystalline cone is replaced by a corneal g.r.i. lens extension, the exocone, that serves as an optical analogue of the crystalline cone.


2017 ◽  
Vol 24 (6) ◽  
pp. 1120-1136 ◽  
Author(s):  
John P. Sutter ◽  
Lucia Alianelli

The shapes of single lens surfaces capable of focusing divergent and collimated beams without aberration have already been calculated. However, nanofocusing compound refractive lenses (CRLs) require many consecutive lens surfaces. Here a theoretical example of an X-ray nanofocusing CRL with 48 consecutive surfaces is studied. The surfaces on the downstream end of this CRL accept X-rays that are already converging toward a focus, and refract them toward a new focal point that is closer to the surface. This case, so far missing from the literature, is treated here. The ideal surface for aberration-free focusing of a convergent incident beam is found by analytical computation and by ray tracing to be one sheet of a Cartesian oval. An `X-ray approximation' of the Cartesian oval is worked out for the case of small change in index of refraction across the lens surface. The paraxial approximation of this surface is described. These results will assist the development of large-aperture CRLs for nanofocusing.


Isaac Newton (1642-1727, F.R.S. 1672, P.R.S. 1703-1727) is generally I credited with the invention of the reflecting telescope, having conceived the idea in 1666* (1, 2, 3). In fact Gregory (4) and others (5) had by that time already considered telescopes employing curved mirrors, but late in 1668 Newton was the first to construct a working model (1,6). This instrument was also the first to employ a small elliptical plane mirror, inclined at 450 to the optic axis, to reflect the convergent beam from the primary mirror to an eyepiece mounted on the side of the telescope tube—a compact and very successful design now universally recognized as the Newtonian reflector. A second instrument made in the Autumn of 1671 (2) proved ‘sensibly better’ than the first. W ord of the invention reached the Royal Society, and Newton was invited to send a telescope for inspection by the Fellows. He dispatched the recentlycompleted second model, and it arrived in London in December 1671 (6, 7). At the meeting held n January 1672 (8) it was announced that the telescope had been examined at Whitehall by the King (Charles II), the President (Lord Brouncker), Sir Robert Moray, Sir Paul Neile, Dr Christopher W ren, and Mr Hooke; and they had formed so good an opinion of it that they had requested the Secretary (Henry Oldenburg) to send a formal description of the instrument to Christiaan Huygens in Paris, in order to secure the rights of the invention to Newton.


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