scholarly journals Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer

2015 ◽  
Vol 23 (4) ◽  
pp. 4065 ◽  
Author(s):  
Yangjin Kim ◽  
Kenichi Hibino ◽  
Naohiko Sugita ◽  
Mamoru Mitsuishi
Keyword(s):  
Optical Thickness ◽  
Thickness Measurement ◽  
Wavelength Tuning ◽  
Fizeau Interferometer ◽  
Transparent Plate ◽  
Fraction Method

Effect of scattered light on the accuracy of thin clouds optical thickness measurement by a sun photometer

1994 ◽  
Author(s):  
Iosif L. Katsev ◽  
Eleonora P. Zege ◽  
Alexander S. Prikhach ◽  
Igor N. Polonsky
Keyword(s):  
Optical Thickness ◽  
Scattered Light ◽  
Thickness Measurement ◽  
Sun Photometer

scholarly journals High-Resolution Optical Thickness Measurement Based on Electro-Optic Dual-Optical Frequency Comb Sources

2017 ◽  
Vol 23 (2) ◽  
pp. 140-146 ◽  
Author(s):  
Oscar E. Bonilla-Manrique ◽  
Pedro Martin-Mateos ◽  
Borja Jerez ◽  
Marta Ruiz-Llata ◽  
Pablo Acedo
Keyword(s):  
High Resolution ◽  
Optical Thickness ◽  
Frequency Comb ◽  
Thickness Measurement ◽  
Optical Frequency Comb ◽  
Optical Frequency ◽  
Electro Optic

Aerosol Optical Thickness Measurement with Elevation-Scanning Lidar

2015 ◽  
Vol 32 (7) ◽  
pp. 1364-1371
Author(s):  
Pavel I. Ionov ◽  
Andrew K. Mollner
Keyword(s):  
Optical Thickness ◽  
Thickness Measurement ◽  
High Accuracy ◽  
Sufficient Accuracy ◽  
Aerosol Optical Thickness ◽  
Calibration Standards ◽  
Accuracy Measurement ◽  
Scanning Lidar ◽  
Sun Photometer ◽  
High Accuracy Measurement

AbstractHigh-accuracy measurement of aerosol optical thickness (AOT) τa with an elevation-scanning lidar is demonstrated and the results are compared with a collocated Cimel 318 sun photometer. Linear regression of the time-coincident data from a 2-week measurement campaign with the two instruments is found to be τalidar = (1.00 ± 0.17)τaphot + (0.025 ± 0.019) (1σ). The method proved to have sufficient accuracy to measure AOTs of 0.1–0.2 commonly seen in relatively clear atmosphere. The measurement is absolute and thus does not depend on any external calibration standards.

Simultaneous measurement of the surface shape and thickness for an optical flat with a wavelength-tuning Fizeau interferometer with suppression of drift error

2020 ◽  
Vol 59 (4) ◽  
pp. 991
Author(s):  
Yangjin Kim ◽  
Younghoon Moon ◽  
Kenichi Hibino ◽  
Naohiko Sugita ◽  
Mamoru Mitsuishi
Keyword(s):  
Simultaneous Measurement ◽  
Wavelength Tuning ◽  
Surface Shape ◽  
Fizeau Interferometer
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