Optimized designs for telecom-wavelength quantum light sources based on hybrid circular Bragg gratings

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

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Tandem scanning confocal light microscopy as compared with x-ray diffraction for characterizing the behavior of clays in fluid-saturated petroleum reservoir rock

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152719 ◽

1989 ◽

Vol 47 ◽

pp. 148-149

Author(s):

C.J. Stuart ◽

B.E. Viani ◽

J. Walker ◽

T.H. Levesque

Keyword(s):

Light Microscopy ◽

Image Plane ◽

Reservoir Rock ◽

Depth Of Field ◽

Objective Lens ◽

Scanning System ◽

Light Sources ◽

Petroleum Reservoir ◽

Image Recording ◽

Scan Speed

Many techniques of imaging used to characterize petroleum reservoir rocks are applied to dehydrated specimens. In order to directly study behavior of fines in reservoir rock at conditions similar to those found in-situ these materials need to be characterized in a fluid saturated state.Standard light microscopy can be used on wet specimens but depth of field and focus cannot be obtained; by using the Tandem Scanning Confocal Microscope (TSM) images can be produced from thin focused layers with high contrast and resolution. Optical sectioning and extended focus images are then produced with the microscope. The TSM uses reflected light, bulk specimens, and wet samples as opposed to thin section analysis used in standard light microscopy. The TSM also has additional advantages: the high scan speed, the ability to use a variety of light sources to produce real color images, and the simple, small size scanning system. The TSM has frame rates in excess of normal TV rates with many more lines of resolution. This is accomplished by incorporating a method of parallel image scanning and detection. The parallel scanning in the TSM is accomplished by means of multiple apertures in a disk which is positioned in the intermediate image plane of the objective lens. Thousands of apertures are distributed in an annulus, so that as the disk is spun, the specimen is illuminated simultaneously by a large number of scanning beams with uniform illumination. The high frame speeds greatly simplify the task of image recording since any of the normally used devices such as photographic cameras, normal or low light TV cameras, VCR or optical disks can be used without modification. Any frame store device compatible with a standard TV camera may be used to digitize TSM images.

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