Tandem scanning confocal light microscopy as compared with x-ray diffraction for characterizing the behavior of clays in fluid-saturated petroleum reservoir rock

1989 ◽  
Vol 47 ◽  
pp. 148-149
Author(s):  
C.J. Stuart ◽  
B.E. Viani ◽  
J. Walker ◽  
T.H. Levesque
Keyword(s):  
Light Microscopy ◽  
Image Plane ◽  
Reservoir Rock ◽  
Depth Of Field ◽  
Objective Lens ◽  
Scanning System ◽  
Light Sources ◽  
Petroleum Reservoir ◽  
Image Recording ◽  
Scan Speed

Many techniques of imaging used to characterize petroleum reservoir rocks are applied to dehydrated specimens. In order to directly study behavior of fines in reservoir rock at conditions similar to those found in-situ these materials need to be characterized in a fluid saturated state.Standard light microscopy can be used on wet specimens but depth of field and focus cannot be obtained; by using the Tandem Scanning Confocal Microscope (TSM) images can be produced from thin focused layers with high contrast and resolution. Optical sectioning and extended focus images are then produced with the microscope. The TSM uses reflected light, bulk specimens, and wet samples as opposed to thin section analysis used in standard light microscopy. The TSM also has additional advantages: the high scan speed, the ability to use a variety of light sources to produce real color images, and the simple, small size scanning system. The TSM has frame rates in excess of normal TV rates with many more lines of resolution. This is accomplished by incorporating a method of parallel image scanning and detection. The parallel scanning in the TSM is accomplished by means of multiple apertures in a disk which is positioned in the intermediate image plane of the objective lens. Thousands of apertures are distributed in an annulus, so that as the disk is spun, the specimen is illuminated simultaneously by a large number of scanning beams with uniform illumination. The high frame speeds greatly simplify the task of image recording since any of the normally used devices such as photographic cameras, normal or low light TV cameras, VCR or optical disks can be used without modification. Any frame store device compatible with a standard TV camera may be used to digitize TSM images.

Light Microscopy Image Collection: Confocal, Widefield and Deconvolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 371-372
Author(s):  
J. N. Turner ◽  
D. H. Szarowski ◽  
B. Roysam ◽  
T. J. Holmes
Keyword(s):  
Light Microscopy ◽  
Three Dimensional ◽  
Image Plane ◽  
Depth Of Field ◽  
Objective Lens ◽  
Biological Applications ◽  
Optical Sectioning ◽  
Microscopy Image ◽  
And Function ◽  
Image Collection

Light microscopy instrumentation and biological applications continue to expand rapidly, and an important aspect of this expansion is three-dimensional (3-D) imaging and image analysis. For many biological specimens, optical sectioning, i.e. collecting images at a sequence of depths under controlled conditions, provides true 3-D data through the entire specimen. This is especially important for specimens whose thickness exceeds the depth-of-field of the microscope objective lens. This sequence of optical sections is the basis for 3-D image reconstruction providing information from all three specimen dimensions instead of just the traditional two in the image plane of the microscope. The analysis of images in 3-D provides insights into the structure and function of biological specimens that are not available through other means. However, 3-D microscopy also presents additional choices for image collection. The first of which is whether to use widefield or confocal microscopy and the second is whether to utilize digital deblurring or deconvolution methods.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Transmission Scanning Electron Microscopy and Energy Analysis with the Siemens ELMISKOP 101

1972 ◽  
Vol 30 ◽  
pp. 450-451
Author(s):  
H. M. Thieringer
Keyword(s):  
Objective Lens ◽  
Transmission Microscopy ◽  
Image Recording ◽  
Mode Of Operation ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
And Performance ◽  
Convergent Beam ◽  
Ray Path ◽  
Beam Diffraction

It has repeatedly been show that with conventional electron microscopes very fine electron probes can be produced, therefore allowing various micro-techniques such as micro recording, X-ray microanalysis and convergent beam diffraction. In this paper the function and performance of an SIEMENS ELMISKOP 101 used as a scanning transmission microscope (STEM) is described. This mode of operation has some advantages over the conventional transmission microscopy (CTEM) especially for the observation of thick specimen, in spite of somewhat longer image recording times.Fig.1 shows schematically the ray path and the additional electronics of an ELMISKOP 101 working as a STEM. With a point-cathode, and using condensor I and the objective lens as a demagnifying system, an electron probe with a half-width ob about 25 Å and a typical current of 5.10-11 amp at 100 kV can be obtained in the back focal plane of the objective lens.

Electron holography of p-n junctions

1996 ◽  
Vol 54 ◽  
pp. 974-975
Author(s):  
B.G. Frost ◽  
D.C. Joy ◽  
L.F. Allard ◽  
E. Voelkl
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Field Emission ◽  
Ccd Camera ◽  
Image Plane ◽  
Reference Wave ◽  
Field Of View ◽  
Control Mode ◽  
Objective Lens ◽  
Electron Holography

A wide holographic field of view (up to 15 μm in the Hitachi-HF2000) is achieved in a TEM by switching off the objective lens and imaging the sample by the first intermediate lens. Fig.1 shows the corresponding ray diagram for low magnification image plane off-axis holography. A coherent electron beam modulated by the sample in its amplitude and its phase is superimposed on a plane reference wave by a negatively biased Möllenstedt-type biprism.Our holograms are acquired utilizing a Hitachi HF-2000 field emission electron microscope at 200 kV. Essential for holography are a field emission gun and an electron biprism. At low magnification, the excitation of each lens must be appropriately adjusted by the free lens control mode of the microscope. The holograms are acquired by a 1024 by 1024 slow-scan CCD-camera and processed by the “Holoworks” software. The hologram fringes indicate positively and negatively charged areas in a sample by the direction of the fringe bending (Fig.2).

Quantitative analysis by reconstruction of HREM focal series

1994 ◽  
Vol 52 ◽  
pp. 740-741
Author(s):  
W. Coene ◽  
A. Thust ◽  
M. Op de Beeck ◽  
D. Van Dyck
Keyword(s):  
Phase Retrieval ◽  
Image Plane ◽  
Initial Guess ◽  
Recursive Least Squares ◽  
Objective Lens ◽  
Electron Wave ◽  
Electron Sources ◽  
Original Algorithm ◽  
Coherent Field ◽  
Direct Interpretation

Compared to conventional electron sources, the use of a highly coherent field-emission gun (FEG) in TEM improves the information resolution considerably. A direct interpretation of this extra information, however, is hampered since amplitude and phase of the electron wave are scrambled in a complicated way upon transfer from the specimen exit plane through the objective lens towards the image plane. In order to make the additional high-resolution information interpretable, a phase retrieval procedure is applied, which yields the aberration-corrected electron wave from a focal series of HRTEM images (Coene et al, 1992).Kirkland (1984) tackled non-linear image reconstruction using a recursive least-squares formalism in which the electron wave is modified stepwise towards the solution which optimally matches the contrast features in the experimental through-focus series. The original algorithm suffers from two major drawbacks : first, the result depends strongly on the quality of the initial guess of the first step, second, the processing time is impractically high.

Electron Holography Improving Transmission Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 208-209
Author(s):  
Hannes Lichte
Keyword(s):  
Electron Microscopy ◽  
Transfer Functions ◽  
Imaging System ◽  
Spherical Aberration ◽  
Image Plane ◽  
Chromatic Aberration ◽  
Object Wave ◽  
Objective Lens ◽  
Electron Holography ◽  
Wave Aberration

Generally, the electron object wave o(r) is modulated both in amplitude and phase. In the image plane of an ideal imaging system we would expect to find an image wave b(r) that is modulated in exactly the same way, i. e. b(r) =o(r). If, however, there are aberrations, the image wave instead reads as b(r) =o(r) * FT(WTF) i. e. the convolution of the object wave with the Fourier transform of the wave transfer function WTF . Taking into account chromatic aberration, illumination divergence and the wave aberration of the objective lens, one finds WTF(R) = Echrom(R)Ediv(R).exp(iX(R)) . The envelope functions Echrom(R) and Ediv(R) damp the image wave, whereas the effect of the wave aberration X(R) is to disorder amplitude and phase according to real and imaginary part of exp(iX(R)) , as is schematically sketched in fig. 1.Since in ordinary electron microscopy only the amplitude of the image wave can be recorded by the intensity of the image, the wave aberration has to be chosen such that the object component of interest (phase or amplitude) is directed into the image amplitude. Using an aberration free objective lens, for X=0 one sees the object amplitude, for X= π/2 (“Zernike phase contrast”) the object phase. For a real objective lens, however, the wave aberration is given by X(R) = 2π (.25 Csλ3R4 + 0.5ΔzλR2), Cs meaning the coefficient of spherical aberration and Δz defocusing. Consequently, the transfer functions sin X(R) and cos(X(R)) strongly depend on R such that amplitude and phase of the image wave represent only fragments of the object which, fortunately, supplement each other. However, recording only the amplitude gives rise to the fundamental problems, restricting resolution and interpretability of ordinary electron images:

scholarly journals Recurrent neural network-based volumetric fluorescence microscopy

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Luzhe Huang ◽  
Hanlong Chen ◽  
Yilin Luo ◽  
Yair Rivenson ◽  
Aydogan Ozcan
Keyword(s):  
Neural Network ◽  
Image Reconstruction ◽  
Fluorescence Microscopy ◽  
Recurrent Network ◽  
Sample Volume ◽  
Depth Of Field ◽  
Objective Lens ◽  
Wide Field ◽  
Volumetric Imaging ◽  
3D Image Reconstruction

AbstractVolumetric imaging of samples using fluorescence microscopy plays an important role in various fields including physical, medical and life sciences. Here we report a deep learning-based volumetric image inference framework that uses 2D images that are sparsely captured by a standard wide-field fluorescence microscope at arbitrary axial positions within the sample volume. Through a recurrent convolutional neural network, which we term as Recurrent-MZ, 2D fluorescence information from a few axial planes within the sample is explicitly incorporated to digitally reconstruct the sample volume over an extended depth-of-field. Using experiments on C. elegans and nanobead samples, Recurrent-MZ is demonstrated to significantly increase the depth-of-field of a 63×/1.4NA objective lens, also providing a 30-fold reduction in the number of axial scans required to image the same sample volume. We further illustrated the generalization of this recurrent network for 3D imaging by showing its resilience to varying imaging conditions, including e.g., different sequences of input images, covering various axial permutations and unknown axial positioning errors. We also demonstrated wide-field to confocal cross-modality image transformations using Recurrent-MZ framework and performed 3D image reconstruction of a sample using a few wide-field 2D fluorescence images as input, matching confocal microscopy images of the same sample volume. Recurrent-MZ demonstrates the first application of recurrent neural networks in microscopic image reconstruction and provides a flexible and rapid volumetric imaging framework, overcoming the limitations of current 3D scanning microscopy tools.

scholarly journals Extended Dual-Focus Microscopy for Ratiometric-Based 3D Movement Tracking

2020 ◽  
Vol 10 (18) ◽  
pp. 6243
Author(s):  
Seohyun Lee ◽  
Hyuno Kim ◽  
Hideo Higuchi
Keyword(s):  
Drug Delivery ◽  
High Resolution ◽  
Optical Axis ◽  
Three Dimensional ◽  
Virus Transmission ◽  
Living Cells ◽  
Depth Of Field ◽  
Objective Lens ◽  
Accurate Localization ◽  
Movement Tracking

Imaging the three-dimensional movement of small organelles in living cells can provide key information for the dynamics of drug delivery and virus transmission in biomedical disciplines. To stably monitor such intracellular motion using microscope, long depth of field along optical axis and accurate three-dimensional tracking are simultaneously required. In the present work, we suggest an extended dual-focus optics microscopy system by combining a bifocal plane imaging scheme and objective lens oscillation, which enables accurate localization for a long axial range. The proposed system exploits high-resolution functionality by concatenating partial calibration result acquired each axial imaging level, maintaining the practical advantages of ratiometric method.

scholarly journals Light source optimization for partially coherent holographic displays with consideration of speckle contrast, resolution, and depth of field

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Seungjae Lee ◽  
Dongyeon Kim ◽  
Seung-Woo Nam ◽  
Byounghyo Lee ◽  
Jaebum Cho ◽  
...  
Keyword(s):  
Light Source ◽  
Safety Issue ◽  
Theoretical Models ◽  
Partial Coherence ◽  
Speckle Reduction ◽  
Depth Of Field ◽  
Light Sources ◽  
Speckle Contrast ◽  
Partially Coherent ◽  
Holographic Displays

Abstract Speckle reduction is an important topic in holographic displays as speckles not only reduce signal-to-noise ratio but also possess an eye-safety issue. Despite thorough exploration of speckle reduction methods using partially coherent light sources, the trade-off involved by the partial coherence has not been thoroughly discussed. Here, we introduce theoretical models that quantify the effects of partial coherence on the resolution and the speckle contrast. The theoretical models allow us to find an optimal light source that maximizes the speckle reduction while minimizing the decline of the other terms. We implement benchtop prototypes of partially coherent holographic displays using the optimal light source, and verify the theoretical models via simulation and experiment. We also present a criterion to evaluate the depth of field in partially coherent holographic displays. We conclude with a discussion about approximations and limitations inherent in the theoretical models.

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