Broadband multilayer-coated normal incidence blazed grating with ~10% diffraction efficiency through the 13-16 nm wavelength region

2009 ◽  
Vol 34 (6) ◽  
pp. 818 ◽  
Author(s):  
Lichao Zhang ◽  
Hui Lin ◽  
Chunshui Jin ◽  
Hongjun Zhou ◽  
Tonglin Huo
1986 ◽  
Vol 64 (3) ◽  
pp. 330-333 ◽  
Author(s):  
Y. N. Joshi ◽  
Th. A. M. Van Kleef

The spectra of arsenic, selenium, and bromine were photographed in the wavelength region 450–2000 Å on 6.65- and 3-m normal-incidence spectrographs using a triggered spark source. The new observations have led us to revise and extend the As V, Se VI, and Br VII spectra.


Author(s):  
J. Zhu ◽  
K. Zong ◽  
F. Goudail ◽  
N. Zhang ◽  
X. Hou

Abstract. Imaging polarimetry can obtain two-dimensional intensity distribution information and its corresponding states of polarization from the target simultaneously. Sagnac polarization imaging interferometer is one of the typical channeled polarimetry technologies. By splitting the incident light through the triangular optical structure, the polarization information of the target is modulated into the interference fringes and can be obtained by the demodulation algorithm. The non-ideal optical elements in the system will cause reconstruction errors. This article analyses several factors that affect the measurement accuracy, including the splitting ratio of polarization beam splitter and the diffraction efficiency of the blazed grating. We derive the modified intensity formula and obtain interference patterns through numerical simulations. By calculating the modulation degree of interference fringes and reconstruction error under different non-ideal parameters, we have come to the conclusion that to meet the requirement of modulation degree > 0.5 and reconstruction error < 10%, the beam splitting ratio of the PBS should be α < 1.22. The diffraction efficiency ratio of s-polarization to p-polarization of the blazed grating should be ηs/ηp > 0.83, and the first-order diffraction efficiency should be η1 > 79%.


2019 ◽  
Vol 46 (3) ◽  
pp. 0313001
Author(s):  
刘全 Liu Quan ◽  
吴建宏 Wu Jianhong ◽  
郭培亮 Guo Peiliang ◽  
陈新华 Chen Xinhua

1990 ◽  
Vol 2 (4) ◽  
pp. 241-248
Author(s):  
S. V. Gaponov ◽  
S. A. Gusev ◽  
V. V. Dubrov ◽  
A. I. Kuzmichev ◽  
B. M. Luskin ◽  
...  

1995 ◽  
Vol 34 (28) ◽  
pp. 6453 ◽  
Author(s):  
J. F. Seely ◽  
M. P. Kowalski ◽  
W. R. Hunter ◽  
T. W. Barbee ◽  
R. G. Cruddace ◽  
...  

1993 ◽  
Vol 32 (25) ◽  
pp. 4890 ◽  
Author(s):  
J. F. Seely ◽  
M. P. Kowalski ◽  
W. R. Hunter ◽  
J. C. Rife ◽  
T. W. Barbee ◽  
...  

X-ray gratings have been developed for use in the wavelength region of 0.01-20 nm, where it is required to employ a grazing incidence configuration. The gratings have a rectangular profile and radiation is diffracted both from the tops and bottoms of the grooves. They therefore differ from blazed gratings, used at grazing incidence, in that a substantial portion of the grating participates in the diffraction process. A scalar diffraction theory has been developed which demonstrates that grating diffraction efficiency varies periodically with wavelength, pitch, groove depth and incidence angle. The theory can be used to optimize grating parameters for most efficient use in any selected region of the spectrum. The gratings are produced by processing a ruled 300 lines per millimetre master grating, so that surface profile defects introduced by ruling are eliminated. Grating performance has been assessed by means of a specially designed grating analyser in addition to spectrometers and a spectrograph. The experimental results are in qualitative agreement with theory. At very short wavelengths of 0.05 nm and grazing incidence angles of about 5', the diffraction efficiency in the first order is below 1 %. The efficiency rises rapidly to between 5 and 10 % at 0.15 nm and to 20 % in the 1 nm region where the incidence angles are typically a few degrees.


2006 ◽  
Vol 45 (8) ◽  
pp. 1676 ◽  
Author(s):  
Michael P. Kowalski ◽  
Ralf K. Heilmann ◽  
Mark L. Schattenburg ◽  
Chih-Hao Chang ◽  
Frederick B. Berendse ◽  
...  

1972 ◽  
Vol 25 (6) ◽  
pp. 743 ◽  
Author(s):  
RE Denton ◽  
SG Tomlin

The refractive and absorption indices of thin amorphous germanium films have been obtained from measurements, at normal incidence, of reflectances and transmittances over a wide range of wavelengths. The optical constants derived were in general agreement with the results of Tauc et al. (1964) except in the long wavelength region beyond the absorption edge. The absorption followed the law for indirect transitions from 0�72 to 1�1 eV, and the same law, but with a change in the slope of the curves, from 1�1 eV to the limit of our measurements at about 1�5 eV. The results are consistent with the view that the energy band structure of amorphous germanium is not essentially different from that of the crystalline material, except that the random structure eliminates the restriction that allows only direct transitions with the result that the absorption law for amorphous films is of the same form as for indirect transitions in crystals.


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