The theory, manufacture, structure and performance of n.p.l. x-ray gratings

X-ray gratings have been developed for use in the wavelength region of 0.01-20 nm, where it is required to employ a grazing incidence configuration. The gratings have a rectangular profile and radiation is diffracted both from the tops and bottoms of the grooves. They therefore differ from blazed gratings, used at grazing incidence, in that a substantial portion of the grating participates in the diffraction process. A scalar diffraction theory has been developed which demonstrates that grating diffraction efficiency varies periodically with wavelength, pitch, groove depth and incidence angle. The theory can be used to optimize grating parameters for most efficient use in any selected region of the spectrum. The gratings are produced by processing a ruled 300 lines per millimetre master grating, so that surface profile defects introduced by ruling are eliminated. Grating performance has been assessed by means of a specially designed grating analyser in addition to spectrometers and a spectrograph. The experimental results are in qualitative agreement with theory. At very short wavelengths of 0.05 nm and grazing incidence angles of about 5', the diffraction efficiency in the first order is below 1 %. The efficiency rises rapidly to between 5 and 10 % at 0.15 nm and to 20 % in the 1 nm region where the incidence angles are typically a few degrees.

2014 ◽  
Vol 03 (02) ◽  
pp. 1440008 ◽  
Author(s):  
M. Beilicke ◽  
F. Kislat ◽  
A. Zajczyk ◽  
Q. Guo ◽  
R. Endsley ◽  
...  

X-ray polarimetry promises to give qualitatively new information about high-energy astrophysical sources, such as binary black hole systems, micro-quasars, active galactic nuclei, neutron stars, and gamma-ray bursts. We designed, built and tested a X-ray polarimeter, X-Calibur, to be used in the focal plane of the balloon-borne InFOCμS grazing incidence X-ray telescope. X-Calibur combines a low-Z scatterer with a Cadmium Zinc Telluride (CZT) detector assembly to measure the polarization of 20–80 keV X-rays making use of the fact that polarized photons scatter preferentially perpendicular to the electric field orientation. X-Calibur achieves a high detection efficiency of ≃80%. The X-Calibur detector assembly is completed, tested, and fully calibrated. The response to a polarized X-ray beam was measured successfully at the Cornell High Energy Synchrotron Source. This paper describes the design, calibration and performance of the X-Calibur polarimeter. In principle, a similar space-borne scattering polarimeter could operate over the broader 2–100 keV energy band.


1998 ◽  
Vol 5 (3) ◽  
pp. 488-490 ◽  
Author(s):  
Yasuo Takagi ◽  
Masao Kimura

A new and more `generalized' grazing-incidence-angle X-ray diffraction (G-GIXD) method which enables simultaneous measurements both of in- and out-of-plane diffraction images from surface and interface structures has been developed. While the method uses grazing-incidence-angle X-rays like synchrotron radiation as an incident beam in the same manner as in `traditional' GIXD, two-dimensional (area) detectors like image plates and a spherical-type goniometer are used as the data-collection system. In this way, diffraction images both in the Seemann–Bohlin (out-of-plane) and GIXD geometry (in-plane) can be measured simultaneously without scanning the detectors. The method can be applied not only to the analysis of the in-plane crystal structure of epitaxically grown thin films, but also to more general research topics like the structural analysis of polycrystalline mixed phases of thin surface and interface layers.


1988 ◽  
Vol 3 (2) ◽  
pp. 351-356 ◽  
Author(s):  
Michael F. Toney ◽  
Ting C. Huang ◽  
Sean Brennan ◽  
Zophia Rek

A nominally γ-Fe2O3 thin film (oxidized from an Fe3O4 film) has been structurally depth profiled using x-ray scattering in a grazing incidence, asymmetric Bragg geometry. By varying the grazing incidence angle, the x-ray penetration depth is varied from tens of Angstroms to several thousand Angstroms, slightly larger than the film thickness. At small incidence angles a diffraction pattern characteristic of α-Fe2O3 is observed, while at larger angles the pattern is predominantly from γ-Fe2O3, showing that there is a surface layer of α-Fe2O3. These results are quantified and the thickness of the α phase found to be 90 Å. The presence of the α phase explains a nonferromagnetic layer observed previously. These data together with magnetic and chemical data suggest that the nonferromagnetic layer forms during oxidation of the Fe3O4 film due to outward diffusion of Fe ions and their subsequent oxidation to form α-Fe2O3


1987 ◽  
Vol 2 (4) ◽  
pp. 471-477 ◽  
Author(s):  
G. Lim ◽  
W. Parrish ◽  
C. Ortiz ◽  
M. Bellotto ◽  
M. Hart

A method using synchrotron radiation parallel beam x-ray optics with a small incidence angle α on the specimen and 2Θ-detector scanning is described for depth profiling analysis of thin films. The instrumentation is the same as used for Θ:2Θ synchrotron parallel beam powder diffractometry, except that the specimen is uncoupled from the detector. There is no profile distortion. Below the critical angle for total reflection αc, the top tens of Angstroms are sampled. Depth profiling is controlled to a few Angstroms using a small α and 0.005° steps. The penetration depth increases to several hundred Angstroms as α approaches αc. Above αc there is a rapid increase in penetration depth to a thousand Angstroms or more and the profiling cannot be sensitively controlled. At grazing incidence the peaks are shifted several tenths of a degree by the x-ray refraction and an experimental procedure for calculating the shifts is described. The method is illustrated with an analysis of iron oxide films.


Author(s):  
Ying Cui ◽  
Yadong Yan ◽  
Bingjing Wu ◽  
Qi Li ◽  
Junhua He

A high resolution microscope is designed for plasma hard X-ray (10–20[Formula: see text]keV) imaging diagnosis. This system consists of two toroidal mirrors, which are nearly parallel, with an angle twice that of the grazing incidence angle and a plane mirror for spectral selection and correction of optical axis offset. The imaging characteristics of single toroidal mirror and double mirrors are analyzed in detail by the optical path function. The optical design, parameter optimization, image quality simulation and analysis of the microscope are carried out. The optimized hard X-ray microscope has a resolution better than 5[Formula: see text][Formula: see text]m at 1[Formula: see text]mm object field of view. The experimental data shows that the variation of the resolution is smaller in the direction of incident angle decrease than that in the increasing direction.


1986 ◽  
Vol 84 ◽  
Author(s):  
N.T. Barrett ◽  
G.M. Antonini ◽  
F.R. Thornley ◽  
G.N. Greaves ◽  
A. Manara

AbstractStructural changes occurring at the surface of leached borosilicate glasses containing 3%wt of uranium have been investigated using fluores- cence EXAFS spectroscopy at grazing incidence. X-ray penetration depths between 30 Å and above 1000 Å are possible by varying the incidence angle of the X-ray monochromatic radiation in the vicinity of the critical angle for total external reflection, øc. This enables the surface and bulk structure to be compared. It is found that a local increase in uranium concentration takes place near the surface of the glass during the first 30 minutes of leaching time. Uranium is coordinated with oxygen and other uranium atoms. The local distribution can be modelled by a square planar island structure comprised of uranyl-type units. This structure changes with corrosion time. After 30 minutes of leaching there is evidence of partial removal of the surface layer.


2013 ◽  
Vol 26 (5) ◽  
pp. 13-16 ◽  
Author(s):  
Ryosuke Fukui ◽  
Jangwoo Kim ◽  
Satoshi Matsuyama ◽  
Hirokatsu Yumoto ◽  
Yuichi Inubushi ◽  
...  

1991 ◽  
Vol 238 ◽  
Author(s):  
M. Wormington ◽  
D. K. Bowen ◽  
B. K. Tanner

ABSTRACTWe describe PC- based software which calculates grazing incidence X-ray reflectivity profiles from model thin film structures, including interface grading. We discuss the mathematical principles of the model and benchmark tests for speed of operation on two PC compatible machines are presented. Curvature of the specimen results in selective loss of fringe visibility at low scattering vectors and is treated rigorously. We discuss the treatment of roughness and use a generalized formula that is valid at large and small values of the reflectivity; its effects are illustrated using the program.


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