ERROR ANALYSIS OF THE DISPERSION-COMPENSATED WIDE-BAND POLARIZATION SAGNAC INTERFEROMETER

Abstract. Imaging polarimetry can obtain two-dimensional intensity distribution information and its corresponding states of polarization from the target simultaneously. Sagnac polarization imaging interferometer is one of the typical channeled polarimetry technologies. By splitting the incident light through the triangular optical structure, the polarization information of the target is modulated into the interference fringes and can be obtained by the demodulation algorithm. The non-ideal optical elements in the system will cause reconstruction errors. This article analyses several factors that affect the measurement accuracy, including the splitting ratio of polarization beam splitter and the diffraction efficiency of the blazed grating. We derive the modified intensity formula and obtain interference patterns through numerical simulations. By calculating the modulation degree of interference fringes and reconstruction error under different non-ideal parameters, we have come to the conclusion that to meet the requirement of modulation degree > 0.5 and reconstruction error < 10%, the beam splitting ratio of the PBS should be α < 1.22. The diffraction efficiency ratio of s-polarization to p-polarization of the blazed grating should be ηs/ηp > 0.83, and the first-order diffraction efficiency should be η1 > 79%.

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Broadband multilayer-coated normal incidence blazed grating with ~10% diffraction efficiency through the 13-16 nm wavelength region

Optics Letters ◽

10.1364/ol.34.000818 ◽

2009 ◽

Vol 34 (6) ◽

pp. 818 ◽

Cited By ~ 4

Author(s):

Lichao Zhang ◽

Hui Lin ◽

Chunshui Jin ◽

Hongjun Zhou ◽

Tonglin Huo

Keyword(s):

Diffraction Efficiency ◽

Wavelength Region ◽

Normal Incidence ◽

Blazed Grating

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Design and fabrication of low noise high diffraction efficiency diffractive optical elements

1995 Proceedings. 45th Electronic Components and Technology Conference ◽

10.1109/ectc.1995.517857 ◽

2002 ◽

Author(s):

W. Daschner ◽

M. Larsson ◽

S.H. Lee

Keyword(s):

Diffraction Efficiency ◽

Low Noise ◽

Diffractive Optical Elements ◽

Optical Elements ◽

High Diffraction Efficiency ◽

High Diffraction

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Measuring Optical Properties of Advanced Nano/Micro-Periodic Structures Fabricated by Multi-Exposure Interference Lithography

JSME 2020 Conference on Leading Edge Manufacturing/Materials and Processing ◽

10.1115/lemp2020-8571 ◽

2020 ◽

Author(s):

Shuzo Masui ◽

Masaki Michihata ◽

Kiyoshi Takamasu ◽

Satoru Takahashi

Keyword(s):

Periodic Structures ◽

Low Cost ◽

Industrial Applications ◽

Interference Lithography ◽

High Dispersion ◽

Optical Elements ◽

Precise Control ◽

Periodic Grating ◽

Interference Fringes ◽

Multiple Interference

Abstract Functional optical elements based on nano/micro-periodic structures have attracted much attention. Since the fabrication of these dual-periodic structures requires precise control of periodicity, the semiconductor process such as an electron beam lithography has been mainly employed. However, these techniques have problems with expensive and low throughput for industrial applications. Therefore, there remains a need for low cost and high throughput fabrication methods of dual-periodic structures. Then we developed a multi-exposure interference lithography (MEIL) system using rotational Lloyd’s mirror interferometer to overcome these problems. The advantages of interference lithography are a large processing area and low cost. Our developed rotational Lloyd’s mirror setup enables us to a highly precise superposition of multiple interference fringes by multi-exposure. Furthermore, we developed a measurement setup for reflective diffractive elements using a two axial rotating stage and measured the diffraction properties of the fabricated dual-periodic diffraction gratings. In this paper, as a demonstration, we succeeded in the fabrication of high-dispersion diffraction grating with an enhanced diffraction efficiency of the −3rd order light. The fabricated shapes have a periodicity of 1997 nm and 665 nm. Furthermore, it was confirmed that the intensity of the −3rd order light was enhanced by about 10 times compared to the single periodic grating.

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Comparison of two methods for equalising the diffraction efficiency of different spatial frequency components of holographic optical elements

10.1117/12.2265598 ◽

2017 ◽

Cited By ~ 1

Author(s):

S. Keshri ◽

K. Murphy ◽

V. Toal ◽

I. Naydenova ◽

S. Martin

Keyword(s):

Spatial Frequency ◽

Diffraction Efficiency ◽

Optical Elements ◽

Holographic Optical Elements ◽

Frequency Components

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Metalenses Based on Symmetric Slab Waveguide and c-TiO2: Efficient Polarization-Insensitive Focusing at Visible Wavelengths

Nanomaterials ◽

10.3390/nano8090699 ◽

2018 ◽

Vol 8 (9) ◽

pp. 699 ◽

Cited By ~ 6

Author(s):

Yaoyao Liang ◽

Zhongchao Wei ◽

Jianping Guo ◽

Faqiang Wang ◽

Hongyun Meng ◽

...

Keyword(s):

Berry Phase ◽

Incident Light ◽

Visible Spectrum ◽

Slab Waveguide ◽

Optical Elements ◽

Polarization Insensitive ◽

Wavefront Shaping ◽

Visible Wavelengths ◽

532 Nm ◽

Good Agreement

A key goal of metalens research is to achieve wavefront shaping of light using optical elements with thicknesses on the order of the wavelength. Here we demonstrate ultrathin highly efficient crystalline titanium dioxide metalenses at blue, green, and red wavelengths (λ0 = 453 nm, 532 nm, and 633 nm, respectively) based on symmetric slab waveguide theory. These metalenses are less than 488 nm-thick and capable of focusing incident light into very symmetric diffraction-limited spots with strehl ratio and efficiency as high as 0.96 and 83%, respectively. Further quantitative characterizations about metalenses’ peak focusing intensities and focal spot sizes show good agreement with theoretical calculation. Besides, the metalenses suffer only about 10% chromatic deviation from the ideal spots in visible spectrum. In contrast with Pancharatnam–Berry phase mechanism, which limit their incident light at circular polarization, the proposed method enables metalenses polarization-insensitive to incident light.

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