Integrated all-active Mach-Zehnder wavelength converter with -10dBm signal sensitivity and 15dB dynamic range at 10Gbit/s

1999 ◽  
Author(s):  
C. Janz ◽  
B. Dagens ◽  
A. Bisson ◽  
F. Poingt ◽  
F. Pommereau ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Wavelength Converter ◽  
Signal Sensitivity

Integrated all-active Mach-Zehnder wavelength converter with –10 dBm signal sensitivity and 15 dB dynamic range at 10 Gbit/s

1999 ◽  
Vol 35 (7) ◽  
pp. 588 ◽  
Author(s):  
C. Janz ◽  
B. Dagens ◽  
A. Bisson ◽  
F. Poingt ◽  
F. Pommereau ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Wavelength Converter ◽  
Signal Sensitivity

43Gbps wavelength converter with wide dynamic range of 14 dB

2009 ◽  
Author(s):  
Nobuo Ohata ◽  
Toshiharu Miyahara ◽  
Takeshi Saito ◽  
Eitaro Ishimura ◽  
Takeshi Yamatoya ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Wavelength Converter ◽  
Wide Dynamic Range

Theoretical investigation of the input power dynamic range enhancement of XPM wavelength converter using a CW holding beam

2009 ◽  
Vol 41 (5) ◽  
pp. 349-362 ◽  
Author(s):  
Jeung-Mo Kang ◽  
Sang-Hoon Lee ◽  
Joo-Youp Kim ◽  
Hyuk-Choon Kwon ◽  
Tae-Young Kim ◽  
...  
Keyword(s):  
Theoretical Investigation ◽  
Dynamic Range ◽  
Input Power ◽  
Wavelength Converter ◽  
Power Dynamic

Study on the dynamic range of input power for wavelength converter based on cross-phase modulation in SOAs

2001 ◽  
Vol 200 (1-6) ◽  
pp. 349-354 ◽  
Author(s):  
Yabin Ye ◽  
Xiaoping Zheng ◽  
Hanyi Zhang ◽  
Yanhe Li ◽  
Yili Guo
Keyword(s):  
Phase Modulation ◽  
Dynamic Range ◽  
Input Power ◽  
Wavelength Converter ◽  
Cross Phase Modulation

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

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