Global shutter pixels with correlated double sampling for CMOS image sensors

2013 ◽  
Vol 2 (2) ◽  
Author(s):  
Guy Meynants
2020 ◽  
Vol 2020 (7) ◽  
pp. 103-1-103-6
Author(s):  
Taesub Jung ◽  
Yonghun Kwon ◽  
Sungyoung Seo ◽  
Min-Sun Keel ◽  
Changkeun Lee ◽  
...  

An indirect time-of-flight (ToF) CMOS image sensor has been designed with 4-tap 7 μm global shutter pixel in back-side illumination process. 15000 e- of high full-well capacity (FWC) per a tap of 3.5 μm pitch and 3.6 e- of read-noise has been realized by employing true correlated double sampling (CDS) structure with storage gates (SGs). Noble characteristics such as 86 % of demodulation contrast (DC) at 100MHz operation, 37 % of higher quantum efficiency (QE) and lower parasitic light sensitivity (PLS) at 940 nm have been achieved. As a result, the proposed ToF sensor shows depth noise less than 0.3 % with 940 nm illuminator in even long distance.


Sensors ◽  
2019 ◽  
Vol 19 (24) ◽  
pp. 5459
Author(s):  
Wei Deng ◽  
Eric R. Fossum

This work fits the measured in-pixel source-follower noise in a CMOS Quanta Image Sensor (QIS) prototype chip using physics-based 1/f noise models, rather than the widely-used fitting model for analog designers. This paper discusses the different origins of 1/f noise in QIS devices and includes correlated double sampling (CDS). The modelling results based on the Hooge mobility fluctuation, which uses one adjustable parameter, match the experimental measurements, including the variation in noise from room temperature to –70 °C. This work provides useful information for the implementation of QIS in scientific applications and suggests that even lower read noise is attainable by further cooling and may be applicable to other CMOS analog circuits and CMOS image sensors.


Author(s):  
Jing Fu ◽  
Jie Feng ◽  
Yu-Dong Li ◽  
Qi Guo ◽  
Ying Wei ◽  
...  

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 172467-172480
Author(s):  
Qihui Zhang ◽  
Ning Ning ◽  
Jing Li ◽  
Qi Yu ◽  
Kejun Wu ◽  
...  

2013 ◽  
Vol 60 (12) ◽  
pp. 4173-4179 ◽  
Author(s):  
Konstantin D. Stefanov ◽  
Zhige Zhang ◽  
Chris Damerell ◽  
David Burt ◽  
Arjun Kar-Roy

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