Giant Magnetoelectric Effect in PZT Thin Film Deposited on Nickel

2016 ◽  
Vol 3 (2) ◽  
Author(s):  
Reema Gupta ◽  
Monika Tomar ◽  
Vinay Gupta ◽  
Yuan Zhou ◽  
Anuj Chopra ◽  
...  
Keyword(s):  
Thin Film ◽  
Lead Zirconate Titanate ◽  
Chemical Solution Deposition ◽  
Magnetoelectric Effect ◽  
Lead Zirconate ◽  
Nickel Foil ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Pzt Thin Films ◽  
Pzt Thin Film

AbstractThe magnetoelectric (ME) effect has been investigated in lead zirconate titanate (PZT) thin film deposited on nickel foil using chemical solution deposition (CSD) technique. The synthesized PZT thin films are found to possess perovskite structure without presence of any intermediate layer. PZT thin film deposited on nickel foil exhibits a good ferroelectric property with a high remnant polarization of about 86 µC/cm

scholarly journals Characterization of Lead Zirconate Titanate—Lanthanum Ruthenate Thin Film Structures Prepared by Chemical Solution Deposition

Scanning ◽  
2007 ◽  
Vol 29 (6) ◽  
pp. 287-293 ◽  
Author(s):  
Andreja BenČan ◽  
Barbara MaliČ ◽  
Goran DraŽiČ ◽  
MiŠo VukadinoviĆ ◽  
Marija Kosec
Keyword(s):  
Thin Film ◽  
Lead Zirconate Titanate ◽  
Chemical Solution Deposition ◽  
Lead Zirconate ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Zirconate Titanate

Epitaxial growth of PbZr0.5Ti0.5O3 thin films on SrRuO3/SrTiO3 substrates using chemical solution deposition: Microstructural and ferroelectric properties

2001 ◽  
Vol 16 (6) ◽  
pp. 1739-1744 ◽  
Author(s):  
J. H. Kim ◽  
Youngman Kim ◽  
A. T. Chien ◽  
F. F. Lange
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Chemical Solution Deposition ◽  
Ferroelectric Properties ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Pzt Thin Films ◽  
Chemical Solution Deposition Method ◽  
Pzt Thin Film ◽  
Film Substrate

Epitaxial PbZr0.5Ti0.5O3 (PZT) thin films were grown on top of a SrRuO3 epitaxial electrode layer on a (100) SrTiO3 substrate by the chemical solution deposition method at various temperatures. The microstructure of the PZT thin films was investigated by x-ray diffraction and transmission electron microscopy, and the ferroelectric properties were measured using the Ag/PZT/SRO capacitor structure. In the PZT thin film annealed at low temperature (450 °C/1h), both the perovskite PZT phase at the film/substrate interface and the fluorite PZT phase in the upper region of the film were obtained. It exhibited nonferroelectric properties. The PZT thin film annealed at temperature as low as 525 °C had only a perovskite tetragonal phase and the epitaxial orientational relationship of (001)[010]PZT∥(001)[010]SRO∥(001)[010]STOwith the substrate, and shows a ferroelectric property. The remnant (Pr) and saturation polarization (Ps) density of the sample annealed at 600 °C/1h were measured to be Pr ˜ 51.4 μC/cm2 and Ps ˜ 62.1 μC/cm2 at 5 V, respectively. The net switched polarization dropped only to 98% of its initial value after 7 × 108 fatigue cycles.

Enhanced Spontaneous Polarization of Dysprosium-substituted Lead Zirconate Titanate Thin Films by a Chemical Solution Deposition Method

2004 ◽  
Vol 830 ◽  
Author(s):  
Hiroshi Uchida ◽  
Hiroshi Nakaki ◽  
Shoji Okamoto ◽  
Shintaro Yokoyama ◽  
Hiroshi Funakubo ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Spontaneous Polarization ◽  
Chemical Solution Deposition ◽  
Lead Zirconate ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Crystal Anisotropy ◽  
Pzt Film ◽  
Zirconate Titanate ◽  
Pzt Films

ABSTRACTInfluences of the B-site substitution using Dy3+ ion on the crystal structure and ferroelectric properties of lead zirconate titanate (PZT) films were investigated. Dy3+-substituted PZT films with nominal chemical compositions of Pb1.00Dyx (Zr0.40Ti0.60)1-(3x/4)O3 (x = 0 ∼ 0.06) were fabricated by a chemical solution deposition (CSD). Polycrystalline PZT films with preferential orientation of (111)PZT were obtained on (111)Pt/TiO2/SiO2/(100)Si substrates, while epitaxially-grown (111)PZT films were fabricated on (111)SrRuO3//(111)Pt//(100)YSZ//(100)Si substrate. Ratio of PZT lattice parameters (c/a), which corresponds to its crystal anisotropy, was enhanced by the Dy3+-substitution with x = 0.02. Spontaneous polarization (Ps) of Dy3+-substituted PZT film (x = 0.02) along polar [001] axis of PZT lattice was estimated from saturation polarization (Psat) value of the epitaxially-grown (111)PZT film on (111)SrRuO3//(111)Pt//(100)YSZ//(100)Si to be 84 μC/cm2 that was significantly larger than that of non-substituted PZT (= 71 μC/cm2). We concluded that the enhancement of Ps value could be achieved by the Dy3+-substitution that promoted the crystal anisotropy of PZT lattice.

scholarly journals Growth of {100}-oriented lead zirconate titanate thin films mediated by a safe solvent

2021 ◽  
Vol 9 (1) ◽  
pp. 281-287
Author(s):  
Nicolas Godard ◽  
Patrick Grysan ◽  
Emmanuel Defay ◽  
Sebastjan Glinšek
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Chemical Solution Deposition ◽  
Lead Zirconate ◽  
Chemical Solution ◽  
Safe Alternative ◽  
Solution Deposition ◽  
Zirconate Titanate

1-Methoxy-2-propanol was found to be a promising safe alternative to carcinogenic and teratogenic 2-methoxyethanol as solvent for chemical solution deposition of {100}-oriented lead zirconate titanate thin films on platinized silicon. 

A comparison of diol and methanol-based chemical solution deposition routes for PZT thin film fabrication

1997 ◽  
Vol 18 (1-4) ◽  
pp. 275-286 ◽  
Author(s):  
Robert W. Schwartz ◽  
Tammy L. Reichert ◽  
Paul G. Clem ◽  
Duane Dimos ◽  
David Liu
Keyword(s):  
Thin Film ◽  
Chemical Solution Deposition ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Thin Film Fabrication ◽  
Pzt Thin Film ◽  
Film Fabrication
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