Application of Arduino-Based Systems as Monitoring Tools in Indoor Comfort Studies: A Bibliometric Analysis

Author(s):  
Eduardo Krüger ◽  
◽  
Ticiana Patel Weiss Trento ◽  
Daniel Trento
ASHA Leader ◽  
2010 ◽  
Vol 15 (11) ◽  
pp. 12-15 ◽  
Author(s):  
Sandra Laing Gillam ◽  
Laura Justice

PCI Journal ◽  
2015 ◽  
Vol 60 (1) ◽  
Author(s):  
José R. Martí-Vargas ◽  
Emili García-Taengua ◽  
W. Micah Hale ◽  
Mohamed K. ElBatanouny ◽  
Paul H. Ziehl

2019 ◽  
Vol 3 ◽  
pp. 13 ◽  
Author(s):  
Vishnu Chandra ◽  
Neil Jain ◽  
Pratik Shukla ◽  
Ethan Wajswol ◽  
Sohail Contractor ◽  
...  

Objectives: The integrated interventional radiology (IR) residency has only been established relatively recently as compared to other specialties. Although some preliminary information is available based on survey data five, no comprehensive bibliometric analysis documenting the importance of the quantity and quality of research in applying to an integrated-IR program currently exists. As the first bibliometric analysis of matched IR residents, the data obtained from this study fills a gap in the literature. Materials and Methods: A list of matched residents from the 2018 integrated-IR match were identified by contacting program directors. The Scopus database was used to search for resident research information, including total publications, first-author publications, radiology-related publications, and h-indices. Each matriculating program was categorized into one of five tiers based on the average faculty Hirsch index (h-index). Results: Sixty-three programs and 117 matched residents were identified and reviewed on the Scopus database. For the 2018 cycle, 274 total publications were produced by matched applicants, with a mean of 2.34 ± 0.41 publication per matched applicant. The average h-index for matched applicants was 0.96 ± 0.13. On univariate analysis, the number of radiology-related publications, highest journal impact factor, and h-index were all associated with an increased likelihood of matching into a higher tier program (P < 0.05). Other research variables displayed no statistical significance. All applicants with PhDs matched into tier one programs. Conclusions: Research serves as an important element in successfully matching into an integrated-IR residency. h-index, number of radiology-related manuscripts, and highest journal impact factors are all positively associated with matching into a higher tier program.


Author(s):  
Terence Kane

Abstract A 300mm wafer atomic force prober (AFP) has been installed into IBM’s manufacturing line to enable rapid, nondestructive electrical identification of defects. Prior to this tool many of these defects could not detected until weeks or months later. Moving failure analysis to the FAB provides a means of complementing existing FAB inspection and defect review tools as well as providing independent, non-destructive electrical measurements at an early point in the manufacturing cycle [1] Once the wafer sites are non destructively AFP characterized, the wafer is returned to its front opening unified pod (FOUP) carrier and may be reintroduced into the manufacturing line without disruption for further inspection or processing. Whole wafer atomic force probe electrical characterization has been applied to 32nm, 28nm, 20nm and 14nm node technologies. In this paper we explore the cost benefits of performing non-destructive AFP measurements on whole wafers. We have found the methodology of employing a whole wafer AFP tool complements existing in-line manufacturing monitoring tools such as brightfield/dark field optical inspection, SEM in-line inspection and in-line E-beam voltage contrast inspection (EBI).


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