RHEED digital image analysis system for in-situ growth rate and alloy composition measurements of GaAs-based nanostructures
2004 ◽
Vol 7
(2)
◽
pp. 147-153
2005 ◽
Vol 14
(2)
◽
pp. 533-537
◽
2001 ◽
Vol 262
(4)
◽
pp. 420-428
◽
Pieter Buma
◽
Martin Groenenberg
◽
Paul F.J.W. Rijken
◽
Wim B. Van Den Berg
◽
Leo Joosten
◽
...
Cristina Pornaro
◽
Stefano Macolino
◽
Michael D. Richardson
1992 ◽
Vol 31
(8)
◽
pp. 1083
Rajeeb Hazra
◽
Charles L. Viles
◽
Stephen K. Park
◽
Stephen E. Reichenbach
◽
Michael E. Sieracki
1993 ◽
Vol 77
(5)
◽
pp. 511
◽
1979 ◽
Vol 11
(5)
◽
pp. 309-310