Analysis of Millimeterwave Amplifier Module with Surface Wave Mode Transmission Line by FDTD Electromagnetic-Semiconductor Device Co-Simulation

2008 ◽  
Vol 128 (6) ◽  
pp. 865-871
Author(s):  
Ryo Ishikawa ◽  
Kazuhiko Honjo ◽  
Masayuki Nakajima
2002 ◽  
Vol 41 (Part 1, No. 3A) ◽  
pp. 1224-1229 ◽  
Author(s):  
Keisuke Shinagawa ◽  
Jin Yamamoto ◽  
Kouta Kusaba ◽  
Haruo Shindo ◽  
Masakazu Furukawa
Keyword(s):  

2011 ◽  
Vol 18 (1) ◽  
pp. 013505 ◽  
Author(s):  
Zhaoquan Chen ◽  
Minghai Liu ◽  
Lingli Hong ◽  
Qiyan Zhou ◽  
Lili Cheng ◽  
...  

1996 ◽  
Vol 124 (1) ◽  
pp. 258-278 ◽  
Author(s):  
Henk Marquering ◽  
Roel Snieder ◽  
Guust Nolet
Keyword(s):  

1990 ◽  
Author(s):  
Glenn J. Rix ◽  
Kenneth H. Stokoe ◽  
Jose M. Roesset

1995 ◽  
Vol 381 ◽  
Author(s):  
James Baker-Jarvis ◽  
Chriss A. Jones

AbstractA review of the most common methods of permittivity measurements on thin films, printed-wiring and circuit boards, and substrates is presented. Transmission-line techniques, coaxial apertures, open resonators, surface-wave modes, and dielectric resonators methods are examined. The frequency range of applicability and typical uncertainties associated with the methods are summarized.


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