International Standardization on Superconducting Power Devices

2014 ◽  
Vol 134 (8) ◽  
pp. 558-559
Author(s):  
Koki TSUNODA ◽  
Teruo MATSUSHITA
Keyword(s):  
Power Devices ◽  
International Standardization

Defect engineering in SiC technology for high-voltage power devices

2020 ◽  
Vol 13 (12) ◽  
pp. 120101
Author(s):  
Tsunenobu Kimoto ◽  
Heiji Watanabe
Keyword(s):  
High Voltage ◽  
Defect Engineering ◽  
Power Devices

Analysis of power devices breakdown behaviour by ion beam and electron beam induced charge microscopy

2008 ◽  
Author(s):  
R. Siemieniec ◽  
A. Pugatschow ◽  
C. Geissler ◽  
H.-J. Schulze ◽  
F.-J. Niedernostheide ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ion Beam ◽  
Power Devices ◽  
Induced Charge
Sign in / Sign up

Export Citation Format

Share Document