Magnetic Sensing, DNA Sensing and Polarization Analysis

2020 ◽  
Vol 140 (9) ◽  
pp. 235-239
Author(s):  
Makoto Tsuruoka
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.


1988 ◽  
Vol 49 (C8) ◽  
pp. C8-199-C8-200
Author(s):  
N. Fanjat ◽  
O. Schaerpf ◽  
J. L. Soubeyroux ◽  
A. J. Dianoux ◽  
G. Lucazeau

2013 ◽  
Vol 34 (11) ◽  
pp. 2548-2553
Author(s):  
Wei Liu ◽  
Sheng-chun Piao ◽  
Han-hao Zhu

Author(s):  
Jose A. Gonzalez ◽  
Lam A. Cheah ◽  
Phil D. Green ◽  
James M. Gilbert ◽  
Stephen R. Ell ◽  
...  

2017 ◽  
Author(s):  
Douglas LaBrecque ◽  
◽  
Russell D. Brigham ◽  
Conny Schmidt-Hattenburger ◽  
Evan Um ◽  
...  

2019 ◽  
Vol 10 ◽  
pp. 1-4
Author(s):  
Teslim Ayinde Fasasi ◽  
Valerio Apicella ◽  
Dong Li ◽  
Antonio Ruotolo

Carbon ◽  
2020 ◽  
Author(s):  
Yunjiao Wang ◽  
Min Cheng ◽  
Liang Wang ◽  
Daming Zhou ◽  
Shixuan He ◽  
...  

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