New approaches to coupling TLC with TOF-SIMS

Abstract In challenging the assumption of autistic social uninterest, Jaswal & Akhtar have opened the door to scrutinizing similar unexamined assumptions embedded in other literatures, such as those on children's typically developing behaviors regarding others’ minds and morals. Extending skeptical analysis to other areas may reveal new approaches for evaluating competing claims regarding social interest in autistic individuals.

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Robert Jütte, Poverty and deviance in early modern Europe (New Approaches to European History, 4). (Cambridge: Cambridge University Press, 1994.) Pages xvi+239. £27.95, paperback £9.95.

Continuity and Change ◽

10.1017/s0268416098213105 ◽

1998 ◽

Vol 13 (1) ◽

pp. 187-191

Author(s):

THOMAS SOKOLL

Keyword(s):

Early Modern ◽

European History ◽

Early Modern Europe ◽

Cambridge University ◽

New Approaches ◽

Modern Europe

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Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135149 ◽

1990 ◽

Vol 48 (2) ◽

pp. 308-309

Author(s):

Bruno Schueler ◽

Robert W. Odom

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Structural Information ◽

Time Of Flight ◽

Biological Tissues ◽

Polymer Surfaces ◽

Tof Sims ◽

Secondary Ions ◽

Ion Mass Spectrometry ◽

Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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