Investigation of optical waveguide formed in Er:Yb:phosphate glass by MeV He+ implantation

Planar waveguide was fabricated in Er:Yb:phosphate glass by a single energy implantation of 2.5 MeV He+ at a dose of 1.6 × 1016 ions/cm2. The waveguide was characterized by prism coupling method, and the refractive index profile was reconstructed using the inverse Wentzel-Kramers-Brillouin method. The photoluminescence was also measured. The energy loss was simulated, and the results were compared and discussed with respect to the refractive index profile in the waveguide.

Download Full-text

Refractive index profile and attenuation measurement in KTiOPO4 waveguide by megaelectronvolt He ions

Journal of Materials Research ◽

10.1557/jmr.2001.0041 ◽

2001 ◽

Vol 16 (1) ◽

pp. 276-279 ◽

Cited By ~ 5

Author(s):

Ke-Ming Wang ◽

Hiu Hu ◽

Fei Lu ◽

Feng Chen ◽

Bo-Rong Shi ◽

...

Keyword(s):

Refractive Index ◽

Room Temperature ◽

Refractive Index Profile ◽

Coupling Method ◽

Index Profile ◽

Fiber Probe ◽

Attenuation Measurement ◽

Probe Technique ◽

Obvious Change ◽

Prism Coupling

An optically polished x-cut KTiOPO4 crystal of size 22×6×1.5mm3 was implanted with 2.8-MeV He ions to a dose of 1.5 × 1016 ions/cm2 at room temperature to form a waveguide. The prism coupling method was used to measure the modes and the fiber probe technique was used to measure the attenuation in the KTiOPO4 waveguide. The refractive index profile, nz, in the KTiOPO4 waveguide was given based on the procedure by Chandler and Lama [P.J. Chandler and F.L. Lama, Optica Acta 33, 123 (1986)]. The waveguide attenuation measured was 2.57 dB/cm for m = 1 mode. After annealing at 260 °C for 30 min, there was no obvious change in the KTiOPO4 waveguide attenuation.

Download Full-text

Measurement error in prism coupling method and refractive index profile reconstruction in ion-exchanged waveguides

Measurement ◽

10.1016/j.measurement.2011.03.015 ◽

2011 ◽

Vol 44 (6) ◽

pp. 1080-1083

Author(s):

Haiyan Chen

Keyword(s):

Refractive Index ◽

Measurement Error ◽

Refractive Index Profile ◽

Coupling Method ◽

Index Profile ◽

Prism Coupling ◽

Profile Reconstruction

Download Full-text

REFRACTIVE INDEX PROFILE RECONSTRUCTION OF PLANAR WAVEGUIDE FROM ITS MODE INTENSITY USING CHARACTERISTIC MATRIX METHOD

Journal of Nonlinear Optical Physics & Materials ◽

10.1142/s0218863501000528 ◽

2001 ◽

Vol 10 (02) ◽

pp. 169-179

Author(s):

HENRI P. URANUS ◽

M. O. TJIA

Keyword(s):

Refractive Index ◽

Intensity Distribution ◽

Planar Waveguide ◽

Nonlinear Least Squares ◽

Refractive Index Profile ◽

Characteristic Matrix ◽

Least Squares Regression ◽

Index Profile ◽

Measured Intensity ◽

Parameter Values

A method is proposed for the reconstruction of refractive index profile of planar waveguide from its fundamental mode intensity profile. The reconstruction is performed by fitting the calculated intensity distribution iteratively with the measured intensity distribution employing nonlinear least-squares regression technique. At each stage of iteration, new trial parameter values are generated and used to form a waveguide model approximated by a multilayer structure with stepwise index distribution, upon which the intensity distribution is then calculated by using the characteristic matrix technique. This method was numerically examined by using samples of either known or unknown analytic expression of the index profile.

Download Full-text