Measurement error in prism coupling method and refractive index profile reconstruction in ion-exchanged waveguides

Measurement ◽  
2011 ◽  
Vol 44 (6) ◽  
pp. 1080-1083
Author(s):  
Haiyan Chen
2001 ◽  
Vol 16 (1) ◽  
pp. 276-279 ◽  
Author(s):  
Ke-Ming Wang ◽  
Hiu Hu ◽  
Fei Lu ◽  
Feng Chen ◽  
Bo-Rong Shi ◽  
...  

An optically polished x-cut KTiOPO4 crystal of size 22×6×1.5mm3 was implanted with 2.8-MeV He ions to a dose of 1.5 × 1016 ions/cm2 at room temperature to form a waveguide. The prism coupling method was used to measure the modes and the fiber probe technique was used to measure the attenuation in the KTiOPO4 waveguide. The refractive index profile, nz, in the KTiOPO4 waveguide was given based on the procedure by Chandler and Lama [P.J. Chandler and F.L. Lama, Optica Acta 33, 123 (1986)]. The waveguide attenuation measured was 2.57 dB/cm for m = 1 mode. After annealing at 260 °C for 30 min, there was no obvious change in the KTiOPO4 waveguide attenuation.


2001 ◽  
Vol 16 (4) ◽  
pp. 1135-1137 ◽  
Author(s):  
Zhuang Zhuo ◽  
Edwin Yue Bun Pun ◽  
Sun Fat Wong ◽  
Ying Zhou

Planar waveguide was fabricated in Er:Yb:phosphate glass by a single energy implantation of 2.5 MeV He+ at a dose of 1.6 × 1016 ions/cm2. The waveguide was characterized by prism coupling method, and the refractive index profile was reconstructed using the inverse Wentzel-Kramers-Brillouin method. The photoluminescence was also measured. The energy loss was simulated, and the results were compared and discussed with respect to the refractive index profile in the waveguide.


1999 ◽  
Author(s):  
Guido Perrone ◽  
Gabriella Motta ◽  
Daniel Pircalaboiu ◽  
Frederica Cappelluti ◽  
Ivo Montrosset

Materials ◽  
2021 ◽  
Vol 14 (5) ◽  
pp. 1282
Author(s):  
Victor Reshetnyak ◽  
Igor Pinkevych ◽  
Timothy Bunning ◽  
Dean Evans

This study theoretically investigated light reflection and transmission in a system composed of a thin metal layer (Ag) adjacent to a rugate filter (RF) having a harmonic refractive index profile. Narrow dips in reflectance and peaks in transmittance in the RF band gap were obtained due to the excitation of a Tamm plasmon polariton (TPP) at the Ag–RF interface. It is shown that the spectral position and magnitude of the TPP dips/peaks in the RF band gap depend on the harmonic profile parameters of the RF refractive index, the metal layer thickness, and the external medium refractive index. The obtained dependences for reflectance and transmittance allow selecting parameters of the system which can be optimized for various applications.


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